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Volumn 482, Issue 3, 2002, Pages 644-652
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The effect of proton damage on the X-ray spectral response of MOS CCDs for the Swift X-ray telescope
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Author keywords
Charge coupled device; Damage; Radiation; Resolution; Spectroscopy; X ray
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Indexed keywords
CHARGE TRANSFER;
CRYSTAL DEFECTS;
ENERGY DISSIPATION;
MOS DEVICES;
PHOTONS;
PROTONS;
RADIATION DAMAGE;
TELESCOPES;
X RAY SPECTROSCOPY;
X RAY TELESCOPES;
CHARGE COUPLED DEVICES;
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EID: 0037149906
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(01)01734-X Document Type: Article |
Times cited : (17)
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References (12)
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