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Volumn 482, Issue 3, 2002, Pages 644-652

The effect of proton damage on the X-ray spectral response of MOS CCDs for the Swift X-ray telescope

Author keywords

Charge coupled device; Damage; Radiation; Resolution; Spectroscopy; X ray

Indexed keywords

CHARGE TRANSFER; CRYSTAL DEFECTS; ENERGY DISSIPATION; MOS DEVICES; PHOTONS; PROTONS; RADIATION DAMAGE; TELESCOPES; X RAY SPECTROSCOPY;

EID: 0037149906     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)01734-X     Document Type: Article
Times cited : (17)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.