The effect of proton damage on the X-ray spectral response of MOS CCDs for the Swift X-ray telescope

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 482, Issue 3, 2002, Pages 644-652

  Ambrosi, R M ^a   Short, A D T ^a   Abbey, A F ^a   Wells, A A ^a   Smith, D R ^a  

^a UNIVERSITY OF LEICESTER   (United Kingdom)

Author keywords

Charge coupled device; Damage; Radiation; Resolution; Spectroscopy; X ray

Indexed keywords

CHARGE TRANSFER; CRYSTAL DEFECTS; ENERGY DISSIPATION; MOS DEVICES; PHOTONS; PROTONS; RADIATION DAMAGE; TELESCOPES; X RAY SPECTROSCOPY;

X RAY TELESCOPES;

CHARGE COUPLED DEVICES;

EID: 0037149906     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)01734-X     Document Type: Article

References (12)

1. Swift XRT: Proton environment and CCD degradation
2. Spectral degradation effects in X-ray CCD's
3. Further radiation evaluation of X-ray sensitive charge coupled devices (CCDs) for the XMM telescope
4. Proton induced Changes in CTE for n-channel CCD's and the effect on star tracker performance