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Volumn 27, Issue 2, 2004, Pages 268-277

Stackable system-on-packages with integrated components

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROLESS PLATING; FLIP CHIP DEVICES; INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS; MICROELECTROMECHANICAL DEVICES; MICROELECTRONICS; NICKEL PLATING; PLASMA ETCHING; PRINTED CIRCUIT BOARDS; SCANNING ELECTRON MICROSCOPY;

EID: 4544250897     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/TADVP.2004.828826     Document Type: Article
Times cited : (39)

References (25)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.