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Volumn 19, Issue 9, 2004, Pages 1113-1116
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The barrier-height inhomogeneity in identically prepared H-terminated Ti/p-Si Schottky barrier diodes
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALLOGRAPHY;
ELECTRIC CURRENTS;
ELECTRIC POTENTIAL;
ETCHING;
FERMI LEVEL;
HYDROFLUORIC ACID;
HYDROPHILICITY;
SEMICONDUCTOR DEVICES;
SEMICONDUCTOR MATERIALS;
SILICON WAFERS;
THERMAL EFFECTS;
THERMIONIC EMISSION;
BALLISTIC ELECTRON EMISSION MICROSCOPY (BEEM);
BARRIER HEIGHTS (BH);
INTERFACIAL LAYERS;
PHOTOVOLTAGE TECHNIQUES;
SCHOTTKY BARRIER DIODES;
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EID: 4544247397
PISSN: 02681242
EISSN: None
Source Type: Journal
DOI: 10.1088/0268-1242/19/9/007 Document Type: Article |
Times cited : (27)
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References (22)
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