Positive photon discrimination for ultra low voltage IC analysis

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2004, Pages 361-369

  Desplats, Romain ^a   Remmach, Mustapha ^a   Faggion, Gaël ^a   Beaudoin, Felix ^a   Perdu, Philippe ^a   Leibowitz, Marty ^b   Sanchez, Kevin ^b   Guilaume, Sam ^b   Lundquist, Ted ^b   Lewis, Dean ^c  

^a CNES   (France)

^b NPTest   (United States)

^c UNIVERSITÉ BORDEAUX 1   (France)

Author keywords

Failure analysis; IC debug; Positive photon discrimination; TRE

Indexed keywords

INTEGRATED CIRCUITS (IC) DEBUG; POSITIVE PHOTON DISCRIMINATION; POWER SUPPLY VOLTAGE; TIME RESOLVED PHOTON EMISSION (TRE);

ELECTRIC FIELDS; ELECTRIC POTENTIAL; EMISSION SPECTROSCOPY; FAILURE ANALYSIS; HEAT RADIATION; HOT CARRIERS; IMPACT IONIZATION; INTEGRATED CIRCUITS; KINETIC ENERGY; LIGHT ABSORPTION; LIGHT TRANSMISSION; PROBABILITY; SEMICONDUCTOR DEVICES; SIGNAL TO NOISE RATIO;

PHOTONS;

EID: 3042516894     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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