-
1
-
-
85036610068
-
Issues in dynamic logic design
-
A. Chandrakasan, W. J. Bowhill, and F. Fox, Eds. Piscataway, NJ: IEEE Press ch. 8
-
P. Gronowski, "Issues in dynamic logic design," in Design of High-Performance Microprocessor Circuits, A. Chandrakasan, W. J. Bowhill, and F. Fox, Eds. Piscataway, NJ: IEEE Press, 2001, ch. 8, pp. 140-157.
-
(2001)
Design of High-Performance Microprocessor Circuits
, pp. 140-157
-
-
Gronowski, P.1
-
2
-
-
0034784853
-
Robustness of sub-70 nm dynamic circuits: Analytical techniques and scaling trends
-
June
-
M. Anders, R. Krishnamurthy, R. Spotten, and K. Soumyauath, "Robustness of sub-70 nm dynamic circuits: Analytical techniques and scaling trends," in Proc. Symp. VLSI Circuit, June 2001, pp. 23-24.
-
(2001)
Proc. Symp. VLSI Circuit
, pp. 23-24
-
-
Anders, M.1
Krishnamurthy, R.2
Spotten, R.3
Soumyauath, K.4
-
3
-
-
0010917424
-
Interconnect and noise immunity design for the Pentium 4 processor
-
R. Kumar. (2001) Interconnect and noise immunity design for the Pentium 4 processor. Intel Technol. J. [Online], vol (5Q1). Available: http://www.intel.com.technology/itj/ql2001/articles/arthtm
-
(2001)
Intel Technol. J.
, vol.5Q1
-
-
Kumar., R.1
-
4
-
-
0346675001
-
Leakage current in deep-submicron CMOS circuits
-
K. Roy, S. Mukhopadhyay, and H. Mahmoodi-Meimand, "Leakage current in deep-submicron CMOS circuits," J. Circuits, Syst. Comput., vol. 11, no. 6, pp. 575-600, 2002.
-
(2002)
J. Circuits, Syst. Comput.
, vol.11
, Issue.6
, pp. 575-600
-
-
Roy, K.1
Mukhopadhyay, S.2
Mahmoodi-Meimand, H.3
-
5
-
-
0033362679
-
Technology and design challenges for low power and high performance
-
Aug
-
V. De and S. Borkar, "Technology and design challenges for low power and high performance," in Proc. Int. Symp. Low Power Electronics and Design, Aug. 1999, pp. 163-168.
-
(1999)
Proc. Int. Symp. Low Power Electronics and Design
, pp. 163-168
-
-
De, V.1
Borkar, S.2
-
6
-
-
84893702398
-
A leakage tolerant high fan-in dynamic circuit design technique
-
Sept
-
J.-J. Kim and K. Roy, "A leakage tolerant high fan-in dynamic circuit design technique," in Proc. 27th Eur. Solid-State Circuit Conf.e, Sept. 2001, pp. 324-327.
-
(2001)
Proc. 27th Eur. Solid-State Circuit Conf.e
, pp. 324-327
-
-
Kim, J.-J.1
Roy, K.2
-
7
-
-
0033711622
-
An energy-efficient leakage-tolerant dynamic circuit technique
-
Sept
-
L. Wang, R. Krishnamurthy, K. Soumyanath, and N. Shanbhag, "An energy-efficient leakage-tolerant dynamic circuit technique," in Proc. Int. ASIC/SOC Conf., Sept. 2000, pp. 221-225.
-
(2000)
Proc. Int. ASIC/SOC Conf.
, pp. 221-225
-
-
Wang, L.1
Krishnamurthy, R.2
Soumyanath, K.3
Shanbhag, N.4
-
8
-
-
0033696540
-
Skewed CMOS: Noise-immune high-performance low-power static circuit family
-
A. Solomatnikov, D. Somasekhar, K. Roy, and C.-K. Koh, "Skewed CMOS: Noise-immune high-performance low-power static circuit family," in Proc. Int. Conf. Computer Design, 2000, pp. 241-246.
-
(2000)
Proc. Int. Conf. Computer Design
, pp. 241-246
-
-
Solomatnikov, A.1
Somasekhar, D.2
Roy, K.3
Koh, C.-K.4
-
9
-
-
0036565318
-
A sub-130-nm conditional-keeper technique
-
May
-
A. Alvandpour, R. K. Krishnamurthy, K. Soumyanath, and S. Y. Borkar, "A sub-130-nm conditional-keeper technique," IEEE J. Solid-State Circuits, vol. 37, pp. 633-638, May 2002.
-
(2002)
IEEE J. Solid-State Circuits
, vol.37
, pp. 633-638
-
-
Alvandpour, A.1
Krishnamurthy, R.K.2
Soumyanath, K.3
Borkar, S.Y.4
-
10
-
-
0042697357
-
Leakage current mechanisms and leakage reduction techniques in deep-submicron CMOS circuits
-
Feb
-
K. Roy, S. Mukhopadhyay, and H. Mahmoodi-Meimand, "Leakage current mechanisms and leakage reduction techniques in deep-submicron CMOS circuits," Proc. IEEE, vol. 91, pp. 305-327, Feb. 2003.
-
(2003)
Proc. IEEE
, vol.91
, pp. 305-327
-
-
Roy, K.1
Mukhopadhyay, S.2
Mahmoodi-Meimand, H.3
-
11
-
-
14244267091
-
-
Univ. Berkeley, Berkeley, CA
-
Berkeley Predictive Technology Model. Univ. Berkeley, Berkeley, CA. [Online]. Available: http://www-device.eecs.berkeley.edu/~ptm
-
Berkeley Predictive Technology Model
-
-
-
12
-
-
0036564731
-
A 130-nm 6-GHz 256 × 32 bit leakage-tolerant register file
-
May
-
R. K. Krishnamurthy, A. Alvandpour, G. Balamurugan, N. R. Shanbhag, K. Soumyanath, and S. Y. Borkar, "A 130-nm 6-GHz 256 × 32 bit leakage-tolerant register file," IEEE J. Solid-State Circuits, vol. 37, pp. 624-632, May 2002.
-
(2002)
IEEE J. Solid-State Circuits
, vol.37
, pp. 624-632
-
-
Krishnamurthy, R.K.1
Alvandpour, A.2
Balamurugan, G.3
Shanbhag, N.R.4
Soumyanath, K.5
Borkar, S.Y.6
|