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Volumn 3, Issue , 2004, Pages 1497-1500

A 10 GHz dielectric resonator oscillator using GaN technology

Author keywords

AlGaN GaN HEMT; Microwave FET dielectric resonator oscillator; Phase noise

Indexed keywords

DIELECTRIC DEVICES; FIELD EFFECT TRANSISTORS; HIGH ELECTRON MOBILITY TRANSISTORS; MICROWAVES; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SPURIOUS SIGNAL NOISE;

EID: 4544237739     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (29)

References (10)
  • 1
    • 0036068528 scopus 로고    scopus 로고
    • AlGaN /GaN HFET amplifier performance and limitations
    • R J Trew, " AlGaN /GaN HFET Amplifier Performance and limitations", 2002 IEEE MTT-S, pp1811-1814.
    • 2002 IEEE MTT-S , pp. 1811-1814
    • Trew, R.J.1
  • 2
    • 0001473741 scopus 로고    scopus 로고
    • AlGaN/GaN HEMTs - An overview of device operation and applications
    • U. K. Mishra, P. Parikh, and Y. F. Wu, " AlGaN/GaN HEMTs - An overview of device operation and applications," Proc. IEEE, vol. 90, pp. 1022-1031, 2002.
    • (2002) Proc. IEEE , vol.90 , pp. 1022-1031
    • Mishra, U.K.1    Parikh, P.2    Wu, Y.F.3
  • 6
    • 0029712962 scopus 로고    scopus 로고
    • Reduction of phase noise in single transistor oscillators
    • March
    • M.J. Underhill, " Reduction of phase noise in single transistor oscillators," IEE European Frequency Time Forum, March 1996.
    • (1996) IEE European Frequency Time Forum
    • Underhill, M.J.1
  • 9
    • 0036713881 scopus 로고    scopus 로고
    • Requirements for low intermodulation distortion in GaN-AlxGal-xN high electron mobility transistors: A model assessment
    • T. Li, R. P. Joshi, and R. D. d. Rosario, " Requirements for low intermodulation distortion in GaN-AlxGal-xN high electron mobility transistors: a model assessment," IEEE Trans. Elec. Dev., vol. 49, pp. 1511-1518, 2002
    • (2002) IEEE Trans. Elec. Dev. , vol.49 , pp. 1511-1518
    • Li, T.1    Joshi, R.P.2    Rosario, R.D.D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.