Optical and dielectric properties of CuAl2O4 films synthesized by solid-phase epitaxy

Thin Solid Films

Volumn 515, Issue 17, 2007, Pages 6938-6942

  Leu, L C ^a   Norton, D P ^a   Jellison Jr , G E ^b   Selvamanickam, V ^c   Xiong, X ^c  

^a University of Florida   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c SUPERPOWER INC   (United States)

Author keywords

CuAl2O4; Dielectrics; Oxide; Solid phase epitaxy; Spinel

Indexed keywords

AMORPHOUS FILMS; ANNEALING; COPPER COMPOUNDS; ENERGY GAP; LIGHT TRANSMISSION; MAGNETRON SPUTTERING; PERMITTIVITY; SINGLE CRYSTALS;

DIRECT CURRENT MAGNETRON SPUTTER; POST-DEPOSITION ANNEALING; SOLID-PHASE EPITAXY;

THIN FILMS;

EID: 34247557498     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.02.012     Document Type: Article

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