-
3
-
-
0032116372
-
Phasor averaging for wavefront correction with liquid crystal spatial light modulators
-
Martin F V and Artal P 1998 Phasor averaging for wavefront correction with liquid crystal spatial light modulators Opt. Commun. 152 233-8
-
(1998)
Opt. Commun.
, vol.152
, pp. 233-238
-
-
Martin, F.V.1
Artal, P.2
-
4
-
-
0033875729
-
Liquid crystal phase retarder with broad spectral range
-
Schirmer J and Schmidt-Kaler T 2000 Liquid crystal phase retarder with broad spectral range Opt. Commun. 176 313-17
-
(2000)
Opt. Commun.
, vol.176
, pp. 313-317
-
-
Schirmer, J.1
Schmidt-Kaler, T.2
-
5
-
-
0037090664
-
Thickness measurement of dielectric films by wavelength scanning method
-
Köysal O, Önal D, Özder S and Ecevit F N 2002 Thickness measurement of dielectric films by wavelength scanning method Opt. Commun. 205 1-6
-
(2002)
Opt. Commun.
, vol.205
, pp. 1-6
-
-
Köysal, O.1
Önal, D.2
Özder, S.3
Ecevit, F.N.4
-
6
-
-
0036498351
-
Refractive index of standard oils as a function of wavelength and temperature
-
Khodier S A 2002 Refractive index of standard oils as a function of wavelength and temperature Opt. Laser Technol. 34 125-8
-
(2002)
Opt. Laser Technol.
, vol.34
, pp. 125-128
-
-
Khodier, S.A.1
-
7
-
-
0035500212
-
Characterization of inhomogeneous dielectric coatings with arbitrary refractive index profiles by multiple angle of incidence ellipsometry
-
Tonova D A and Konova A A 2001 Characterization of inhomogeneous dielectric coatings with arbitrary refractive index profiles by multiple angle of incidence ellipsometry Thin Solid Films 397 17-23
-
(2001)
Thin Solid Films
, vol.397
, pp. 17-23
-
-
Tonova, D.A.1
Konova, A.A.2
-
8
-
-
0031553464
-
An integrated optical method for measuring the thickness and refractive index of birefringent thin films
-
Caliendo C, Verona E and Saggio G 1997 An integrated optical method for measuring the thickness and refractive index of birefringent thin films Thin Solid Films 292 255-9
-
(1997)
Thin Solid Films
, vol.292
, pp. 255-259
-
-
Caliendo, C.1
Verona, E.2
Saggio, G.3
-
9
-
-
0033138370
-
Refractive index and thickness determination of monolayers by multi mode waveguide coupled surface plasmons
-
Weisser M, Menges B and Mittler-Neher S 1999 Refractive index and thickness determination of monolayers by multi mode waveguide coupled surface plasmons Sensors Actuators B 56 189-97
-
(1999)
Sensors Actuators B
, vol.56
, pp. 189-197
-
-
Weisser, M.1
Menges, B.2
Mittler-Neher, S.3
-
10
-
-
0000562670
-
Decomposition of Hardy functions into square integrable wavelets of constant shape
-
Grossman A and Morlet J 1984 Decomposition of Hardy functions into square integrable wavelets of constant shape SIAM J. Math. Anal. 15 723-36
-
(1984)
SIAM J. Math. Anal.
, vol.15
, pp. 723-736
-
-
Grossman, A.1
Morlet, J.2
-
14
-
-
0038746010
-
Application of polarimetry and interferometry to liquid crystal-film research
-
Chang R 1972 Application of polarimetry and interferometry to liquid crystal-film research Mater. Res. Bull. 7 267-78
-
(1972)
Mater. Res. Bull.
, vol.7
, pp. 267-278
-
-
Chang, R.1
-
15
-
-
0027789341
-
An introduction to wavelet analysis in oceanography and meteorology: With application to the dispersion of Yanai waves
-
Meyers S D, Kelly B G and O'Brien J J 1993 An introduction to wavelet analysis in oceanography and meteorology: with application to the dispersion of Yanai waves Mon. Weather Rev. 121 2858-66
-
(1993)
Mon. Weather Rev.
, vol.121
, pp. 2566-2858
-
-
Meyers, S.D.1
Kelly, B.G.2
O'Brien, J.J.3
-
17
-
-
1542680533
-
A practical guide to wavelet analysis
-
Wavelet software is available at
-
Torrence C and Compo G P 1998 A practical guide to wavelet analysis Bull. Am. Meteorol. Soc. 79 61-78 Wavelet software is available at http://paos.colorado.edu/research/wavelets/
-
(1998)
Bull. Am. Meteorol. Soc.
, vol.79
, pp. 61-78
-
-
Torrence, C.1
Compo, G.P.2
-
18
-
-
0036131980
-
Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet transform
-
Angrisani L, Bechou L, Dallet D, Daponte P and Ousten Y 2002 Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet transform Measurement 31 77-91
-
(2002)
Measurement
, vol.31
, pp. 77-91
-
-
Angrisani, L.1
Bechou, L.2
Dallet, D.3
Daponte, P.4
Ousten, Y.5
-
19
-
-
0001006355
-
High latitude ionosphere turbulence studied by means of the wavelet transform
-
Lagoutte D, Cerisier J C, Plagnaud J L, Villain J P and Forget B 1992 High latitude ionosphere turbulence studied by means of the wavelet transform J. Atmos. Terr. Phys. 54 1283-93
-
(1992)
J. Atmos. Terr. Phys.
, vol.54
, pp. 1283-1293
-
-
Lagoutte, D.1
Cerisier, J.C.2
Plagnaud, J.L.3
Villain, J.P.4
Forget, B.5
-
20
-
-
85034783908
-
-
Merck KgaA D-64271 Darmstadt, Germany
-
Merck KgaA 2002 D-64271 Darmstadt, Germany
-
(2002)
-
-
|