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Volumn 44, Issue 1, 2008, Pages 127-135

Preparation and characterization of Al doped ZnO thin films by PLD

Author keywords

AFM; EDAX; Hall; Optical transmittance; PLD; Raman; SEM; XRD; ZnO films

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; CONCENTRATION (PROCESS); DOPING (ADDITIVES); ELECTRIC PROPERTIES; ENERGY DISPERSIVE SPECTROSCOPY; OPACITY; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZINC OXIDE;

EID: 44949109951     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2008.03.006     Document Type: Article
Times cited : (78)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.