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Volumn 44, Issue 1, 2008, Pages 127-135
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Preparation and characterization of Al doped ZnO thin films by PLD
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Author keywords
AFM; EDAX; Hall; Optical transmittance; PLD; Raman; SEM; XRD; ZnO films
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Indexed keywords
ALUMINUM;
ATOMIC FORCE MICROSCOPY;
CONCENTRATION (PROCESS);
DOPING (ADDITIVES);
ELECTRIC PROPERTIES;
ENERGY DISPERSIVE SPECTROSCOPY;
OPACITY;
PULSED LASER DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
ZINC OXIDE;
DOPING CONCENTRATION;
OPTICAL TRANSMITTANCE SPECTRA;
THIN FILMS;
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EID: 44949109951
PISSN: 07496036
EISSN: 10963677
Source Type: Journal
DOI: 10.1016/j.spmi.2008.03.006 Document Type: Article |
Times cited : (78)
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References (16)
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