Algorithms for extraction of nanowires attributes from optical section microscopy images

2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007

Volumn 2 PART A, Issue , 2008, Pages 279-290

  Peng, Tao ^a   Gupta, Satyandra K ^a   Balijepalli, Arvind ^a,b   Lebrun, Thomas W ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

(1 1 1) ORIENTATION; AREAS OF INTEREST (AOI); ASSEMBLY CELLS; AUTOMATED ASSEMBLY; BROWNIAN MOTIONS; BUILDING BLOCKS; EXTRACTION TECHNIQUES; FLUIDIC MEDIUM; GENERAL (CO); IMAGE GRADIENTS; IMAGE PATTERNS; INTERNATIONAL DESIGNS; MICROSCOPY IMAGING; NANO MANIPULATION; NANO WIRES; NANO-SCALE DEVICES; ON-LINE MONITORING; OPTICAL (PET) (OPET); TECHNICAL CONFERENCES;

ALGORITHMS; ARCHITECTURAL DESIGN; BROWNIAN MOVEMENT; COMPUTER NETWORKS; COMPUTERS; ELECTRIC WIRE; ENGINEERING; EVOLUTIONARY ALGORITHMS; EXTRACTION; FEATURE EXTRACTION; IMAGE ENHANCEMENT; MICROSCOPES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOWIRES; OPTICAL MICROSCOPY; PARAMETER ESTIMATION; ROBOTIC ASSEMBLY; SOLVENT EXTRACTION; TECHNOLOGY;

OPTICAL TWEEZERS;

EID: 44849107948     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/DETC2007-35456     Document Type: Conference Paper

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