메뉴 건너뛰기




Volumn 23, Issue 5, 2008, Pages 1350-1357

Oxidation of copper alloys studied by analytical transmission electron microscopy cross-sectional specimens

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN SIZE AND SHAPE; OXIDATION; POLYCRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 44649175772     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2008.0160     Document Type: Article
Times cited : (13)

References (18)
  • 3
    • 29044434988 scopus 로고    scopus 로고
    • The low-temperature initial oxidation stages of Cu(100) investigated by in situ ultra-high-vacuum transmission electron microscopy
    • L. Sun and J.C. Yang: The low-temperature initial oxidation stages of Cu(100) investigated by in situ ultra-high-vacuum transmission electron microscopy. J. Mater. Res. 20, 1910 (2005).
    • (2005) J. Mater. Res , vol.20 , pp. 1910
    • Sun, L.1    Yang, J.C.2
  • 4
    • 44649139861 scopus 로고    scopus 로고
    • March 31
    • www.outokumpucopper.com (March 31, 2006).
    • (2006)
  • 5
    • 0038607077 scopus 로고    scopus 로고
    • A study of initial oxidation of copper in 0.1 MPa oxygen and the effect of purity by metallographic methods
    • Y. Zhu, K. Mimura, and M. Isshiki: A study of initial oxidation of copper in 0.1 MPa oxygen and the effect of purity by metallographic methods. Oxid. Metals 59, 575 (2003).
    • (2003) Oxid. Metals , vol.59 , pp. 575
    • Zhu, Y.1    Mimura, K.2    Isshiki, M.3
  • 6
    • 29044451121 scopus 로고    scopus 로고
    • Initial oxiqation kinetics of Cu(100), (110), and (111) thin films investigated by in situ ultra-high-vacuum transmission electron microscopy
    • G. Zhou and J.C. Yang: Initial oxiqation kinetics of Cu(100), (110), and (111) thin films investigated by in situ ultra-high-vacuum transmission electron microscopy. J. Mater. Res. 20, 1684 (2005).
    • (2005) J. Mater. Res , vol.20 , pp. 1684
    • Zhou, G.1    Yang, J.C.2
  • 8
    • 36149069822 scopus 로고
    • The oxidation of metals
    • K. Lawless: The oxidation of metals. Rep. Prog. Phys. 37, 231 (1974).
    • (1974) Rep. Prog. Phys , vol.37 , pp. 231
    • Lawless, K.1
  • 9
    • 0029250834 scopus 로고
    • Copper oxidation and surface copper oxide stability investigated by pulsed field desorption mass spectrometry
    • D. Cocke, G. Chuah, N. Kruse, and J. Block: Copper oxidation and surface copper oxide stability investigated by pulsed field desorption mass spectrometry. Appl. Surf. Sci. 84, 153 (1995).
    • (1995) Appl. Surf. Sci , vol.84 , pp. 153
    • Cocke, D.1    Chuah, G.2    Kruse, N.3    Block, J.4
  • 10
    • 0033344262 scopus 로고    scopus 로고
    • High-temperature oxidation of nickel-plated copper vs pore copper
    • U. Aniekwe and T. Utigard: High-temperature oxidation of nickel-plated copper vs pore copper. Canadian Metall. Quarterly 38, 277 (1999).
    • (1999) Canadian Metall. Quarterly , vol.38 , pp. 277
    • Aniekwe, U.1    Utigard, T.2
  • 11
    • 0033704737 scopus 로고    scopus 로고
    • Deposition of thin films of different oxides of copper by RF reactive sputtering and their characterization
    • S. Ghosh, D. Avasthi, P. Shah, V. Ganesan, A. Gupta, D. Sarangi, R. Bhattacharya, and W. Assmann: Deposition of thin films of different oxides of copper by RF reactive sputtering and their characterization. Vacuum 57, 377 (2000).
    • (2000) Vacuum , vol.57 , pp. 377
    • Ghosh, S.1    Avasthi, D.2    Shah, P.3    Ganesan, V.4    Gupta, A.5    Sarangi, D.6    Bhattacharya, R.7    Assmann, W.8
  • 12
    • 8344278007 scopus 로고    scopus 로고
    • A study of the initial oxidation of copper in 0.1 MPa oxygen and the effect of purity by metallographic methods
    • Y. Zhu, K. Mimura, and M. Isshiki: A study of the initial oxidation of copper in 0.1 MPa oxygen and the effect of purity by metallographic methods. Corros. Sci. 46, 2445 (2004).
    • (2004) Corros. Sci , vol.46 , pp. 2445
    • Zhu, Y.1    Mimura, K.2    Isshiki, M.3
  • 14
    • 29044448129 scopus 로고    scopus 로고
    • 0.5 (001) thin films during in situ oxidation. J. Mater. Res. 20, 1902 (2005).
    • 0.5 (001) thin films during in situ oxidation. J. Mater. Res. 20, 1902 (2005).
  • 15
    • 34547380946 scopus 로고    scopus 로고
    • Low temperature oxidation of copper alloys - AEM and AFM characterization
    • M. Honkanen, M. Vippola, and T. Lepistö: Low temperature oxidation of copper alloys - AEM and AFM characterization. J. Mater. Sci. 42, 4684 (2007).
    • (2007) J. Mater. Sci , vol.42 , pp. 4684
    • Honkanen, M.1    Vippola, M.2    Lepistö, T.3
  • 17
    • 0030951490 scopus 로고    scopus 로고
    • Preparation of cross-sectional TEM samples for low-angle ion milling
    • J. McCaffrey and A. Barna: Preparation of cross-sectional TEM samples for low-angle ion milling. Microsc. Res. Tech. 36, 362 (1997).
    • (1997) Microsc. Res. Tech , vol.36 , pp. 362
    • McCaffrey, J.1    Barna, A.2
  • 18
    • 44649167627 scopus 로고    scopus 로고
    • JCPDS No. 5-667. International Center for Diffraction Data (ICDD), Powder Diffraction File Database 1999.
    • JCPDS No. 5-667. International Center for Diffraction Data (ICDD), Powder Diffraction File Database 1999.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.