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Volumn 5, Issue 5, 2008, Pages 1395-1398

Optical quantities of rough films calculated by Rayleigh-Rice theory

Author keywords

[No Author keywords available]

Indexed keywords

EFFECTIVE MEDIUM APPROXIMATION; EXPERIMENTAL DATA; INCIDENT LIGHT; OPTICAL METHODS; OPTICAL QUANTITIES; RAYLEIGH-RICE THEORIES; ROUGH SURFACES; SCALAR DIFFRACTION THEORY; SILICON SUBSTRATES; SPATIAL FREQUENCY; SPECTROSCOPIC DATA; STATISTICAL PARAMETERS; THEORETICAL APPROACH;

EID: 44649146828     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777766     Document Type: Conference Paper
Times cited : (5)

References (18)
  • 14
    • 0038695308 scopus 로고    scopus 로고
    • Ellipsometry of thin film systems
    • edited by E. Wolf Elsevier, Amsterdam
    • I. Ohlídal and D. Franta, Ellipsometry of thin film systems, in: Progress in Optics, edited by E. Wolf (Elsevier, Amsterdam, 2000), pp. 181-282.
    • (2000) Progress in Optics , pp. 181-282
    • Ohlídal, I.1    Franta, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.