Electronic structure of Cu3N films studied by soft x-ray spectroscopy

Journal of Physics Condensed Matter

Volumn 20, Issue 23, 2008, Pages

  Modin, A ^a   Kvashnina, K O ^a   Butorin, S M ^a   Werme, L ^a   Nordgren, J ^a   Arapan, S ^a,b   Ahuja, R ^a,c   Fallberg, A ^a   Ottosson, M ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b INSTITUTE OF CHEMISTRY   (Moldova)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; SPECTROSCOPIC ANALYSIS; SYNTHESIS (CHEMICAL); THERMAL EFFECTS;

CARBON IMPURITIES; X-RAY EMISSION SPECTRA;

METALLIC FILMS;

EID: 44649117498     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/20/23/235212     Document Type: Article

References (28)

1. Braun KF 1874 Ann. Phys. Chem. 153 556
2. Bardeen J and Brattain WH 1948 Phys. Rev. 74 230
3. Shockley W 1949 Bell Syst. Tech. J. 28 435
4. Pierson JF 2002 Vacuum 66 59
5. Maruyama T and Morishita T 1995 J. Appl. Phys. 78 4104
6. Nosaka T, Yoshitake M, Okamoto A, Ogawa S and Nakayama Y 1999 Thin Solid Films 348 8
7. Kim KJ, Kim JH and Kang JH 2001 J. Cryst. Growth 222 767
8. Ghosh S, Singh F, Choudhary D, Avasthi DK, Ganesan V, Shah P and Gupta A 2001 Surf. Coat. Technol. 142-144 1034
9. Soukup L et al 1999 Surf. Coat. Technol. 116-119 321
10. Borsa DM and Boerma DO 2004 Surf. Sci. 548 95
11. Blucher J, Bang K and Giessen BC 1989 Mater. Sci. Eng. A 117 L1
12. Asano M, Umeda K and Tasaki A 1990 Japan. J. Appl. Phys. 29 1985
13. Nosaka T, Yoshitake M, Okamoto A, Ogawa S and Nakayama Y 2001 Appl. Surf. Sci. 169/170 358
14. Maya L 1993 Mater. Res. Soc. Symp. Proc. 282 203
15. Cremer R, Witthaut M, Neuschutz D, Trappe C, Laurenzis M, Winkler O and Kurz H 2000 Mikrochim. Acta 133 299
16. Pinkas J, Huffman JC, Baxter DV, Chisholm MH and Caulton KG 1995 Chem. Mater. 7 1589
17. Törndahl T, Ottosson M and Carlsson J-O 2006 J. Electrochem. Soc. 153 C146
18. Denecke R, Vaterlein P, Bassler M, Wassdahl N, Butorin S, Nilsson A, Rubensson J-E, Nordgren J, Martensson N and Nyholm R 1999 J. Electron Spectrosc. Relat. Phenom. 101-103 971
19. Warwick T, Heimann P, Mossessian D, McKinney W and Padmore H 1995 Rev. Sci. Instrum. 66 2037
20. http://henke.lbl.gov/optical_constants/filter2.html
21. Nordgren J and Nyholm R 1986 Nucl. Instrum. Methods Phys. Res. A 246 242
22. Nordgren J, Bray G, Cramm S, Nyholm R, Rubensson J-E and Wassdahl N 1989 Rev. Sci. Instrum. 60 1690
23. Kresse G and Furthmüller J 1996 Phys. Rev. B 54 11169
24. Blöchl PE 1994 Phys. Rev. B 50 17953
25. Kresse G and Joubert D 1999 Phys. Rev. B 59 1758
26. Perdew JP, Chevary JA, Vosko SH, Jackson KA, Pederson MR, Singh DJ and Fiolhais C 1992 Phys. Rev. B 46 6671
27. Hahn U and Weber W 1996 Phys. Rev. B 53 12684
28. Moreno-Armenta MG, Martinez-Ruiz A and Takeuchi N 2004 Solid State Sci. 6 9