Simultaneous registration of in- and out-of-plane displacements in modified grating interferometry

Optical Engineering

Volumn 36, Issue 8, 1997, Pages 2240-2248

  Schmit, Joanna ^a,b,c,d   Patorski, Krzysztof ^b,c,f   Creath, Katherine ^a,c,d,e,g  

^a UNIVERSITY OF ARIZONA   (United States)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^c SPIE   (United States)

^d WYKO Corporation   (United States)

^e Optineering   (United States)

^f OSAKA UNIVERSITY   (Japan)

^g UNIVERSITY OF ROCHESTER   (United States)

Author keywords

Grating interferometry; In and out of plane displacements; Optical testing

Indexed keywords

EID: 0011262381     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601446     Document Type: Article

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