Directional orientation of carbon nanotubes on surfaces using a gas flow cell

Nano Letters

Volumn 4, Issue 8, 2004, Pages 1481-1484

  Xin, Huijun ^a   Woolley, Adam T ^a  

^a Brigham Young University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; ARTICLE; GAS FLOW; LIQUID; NANOTUBE; ORIENTATION; SUSPENSION;

EID: 4444305351     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl049192c     Document Type: Article

References (20)

1. Li, S.; Yu, Z.; Yen, S.-F.; Tang, W. C.; Burke, P. J. Nano Lett. 2004, 4, 753-756.
2. Keren, K.; Berman, R. S.; Buchstab, E.; Sivan, U.; Braun, E. Science 2003, 302, 1380-1382.
3. Postma, H. W. Ch.; Teepen, T.; Yao, Z.; Grifoni, M.; Dekker, C. Science 2001, 293, 76-79.
4. Derycke, V.; Martel, R.; Appenzeller, J.; Avouris, Ph. Nano Lett. 2001, 1, 453-456.
5. Qi, P.; Vermesh, O.; Grecu, M.; Javey, A.; Wang, Q.; Dai, H.; Peng, S.; Cho, K. J. Nano Lett. 2003, 3, 347-351.
6. Lin, Y.; Lu, F.; Tu, Y.; Ren, Z. Nano Lett. 2004, 4, 191-195.
7. Nagahara, L. A.; Amlani, I.; Lewenstein, J.; Tsui, R. K. Appl. Phys. Lett. 2002, 80, 3826-3828.
8. Walters, D. A.; Casavant, M. J.; Qin, X. C.; Huffman, C. B.; Boul, P. J.; Ericson, L. M.; Haroz, E. H.; O'Connell, M. J.; Smith, K.; Colbert, D. T.; Smalley, R. E. Chem. Phys. Lett. 2001, 338, 14-20.
9. Choi, K. H.; Bourgoin, J. P.; Auvray, S.; Esteve, D.; Duesberg, G. S.; Roth, S.; Burghard, M. Surf. Sci. 2000, 462, 195-202.
10. Huang, L.; Wind, S. J.; O'Brien, S. P. Nano Lett. 2003, 3, 299-303.
11. Zhang, Y.; Chang, A.; Cao, J.; Wang, Q.; Kim, W.; Li, Y.; Morris, N.; Yenilmez, E.; Kong, J.; Dai, H. Appl. Phys. Lett. 2001, 79, 3155-3157.
12. Huang, S.; Cai, X.; Liu, J. J. Am. Chem. Soc. 2003, 125, 5636-5637.
13. Joselevich, E.; Lieber, C. M. Nano Lett. 2002, 2, 1137-1141.
14. Ko, H.; Peleshanko, S.; Tsukruk, V. V. J. Phys. Chem. B 2004, 108, 4385-4393.
15. Lynch, M. D.; Patrick, D. L. Nano Lett. 2002, 2, 1197-1201.
16. Lay, M. D.; Novak, J. P.; Snow, E. S. Nano Lett. 2004, 4, 603-606.
17. Xin, H.; Woolley, A. T. J. Am. Chem. Soc. 2003, 125, 8710-8711.
18. Images were obtained with a Multimode IIIa AFM instrument (Veeco, Sunnyvale, CA) using microfabricated, aluminum-coated silicon cantilever tips (Nanoscience Instruments, Phoenix, AZ). Vibrational noise was minimized with an active isolation system (MOD1-M, Halcyonics, Goettingen, Germany). Typical imaging parameters were: tip resonance frequency, 55-65 kHz; free oscillation amplitude, 0.9-1.1 V.; setpoint, 0.4-0.7 V.; scan rate, 1.6 Hz. Images were processed offline to remove background curvature using software bundled with the AFM instrument.
19. Woolley, A. T.; Kelly, R. T. Nano Lett. 2001, 1, 345-348.
20. Liu, J.; Casavant, M. J.; Cox, M.; Walters, D. A.; Boul, P.; Lu, W.; Rimberg, A. J.; Smith, K. A.; Colbert, D. T.; Smalley, R. E. Chem. Phys. Lett. 1999, 303, 125-129.