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Volumn 1, Issue , 2004, Pages 35-38

A symmetric and thermally-de-embedded nonlinear FET model for wireless and microwave applications

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE MODEL; LINEARITY; PINCH-OFF VOLTAGE; POWER OUTPUT;

EID: 4444259301     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (19)
  • 1
    • 79960354246 scopus 로고
    • A new empirical nonlinear model for MESFET and HEMT devices
    • I Angelov, H Zirath, N Rorsman, 'A new empirical nonlinear model for MESFET and HEMT devices', IEEE Trans MTT-40 2258-66 (1992)
    • (1992) IEEE Trans , vol.MTT-40 , pp. 2258-2266
    • Angelov, I.1    Zirath, H.2    Rorsman, N.3
  • 2
    • 0026395570 scopus 로고
    • Technology-independent large-signal non-quasi-static FET models by direct construction from automatically characterized device data
    • st EuMC, 927-932 (1991)
    • (1991) st EuMC , pp. 927-932
    • Root, D.E.1    Fan, S.2    Meyer, J.3
  • 4
    • 0019020915 scopus 로고
    • A MESFET model for use in the design of GaAs ICs
    • W R Curtice, 'A MESFET model for use in the design of GaAs ICs', IEEE Trans MTT-28 448-456 (1980)
    • (1980) IEEE Trans , vol.MTT-28 , pp. 448-456
    • Curtice, W.R.1
  • 6
  • 7
    • 4444344076 scopus 로고
    • A measurement-based FET model improves CAE accuracy
    • Sept.
    • D E Root, 'A measurement-based FET model improves CAE accuracy', Microwave Journal 126-139 (Sept. 1991)
    • (1991) Microwave Journal , pp. 126-139
    • Root, D.E.1
  • 8
    • 1342337226 scopus 로고    scopus 로고
    • An examination of several large signal capacitance models to predict GaAs HEMT linear power amplifier performance
    • J Staudinger et al, 'An Examination of Several Large Signal Capacitance Models to Predict GaAs HEMT Linear Power Amplifier Performance', IEEE RAWCON'98 Proc. 343-346 (1998)
    • (1998) IEEE RAWCON'98 Proc. , pp. 343-346
    • Staudinger, J.1
  • 9
    • 4444339215 scopus 로고    scopus 로고
    • Agilent Technologies, Wireless Semiconductor Division, private communication
    • C Park, Agilent Technologies, Wireless Semiconductor Division, private communication
    • Park, C.1
  • 10
    • 0026881708 scopus 로고
    • Experimental evaluation of large-signal modeling assumptions based on vector analysis of bias-dependent S-parameter data from MESFETs and HEMTs
    • D E Root, S Fan, "Experimental Evaluation of Large-Signal Modeling Assumptions Based on Vector Analysis of Bias-Dependent S-Parameter Data from MESFETs and HEMTs", IEEE International Microwave Symposium, 255-258 (1992)
    • (1992) IEEE International Microwave Symposium , pp. 255-258
    • Root, D.E.1    Fan, S.2
  • 13
    • 0031236240 scopus 로고    scopus 로고
    • A realistic large-signal MESFET model for SPICE
    • A E Parker, D J Skellern, 'A realistic large-signal MESFET model for SPICE', IEEE Trans MTT-45 1563-71 (1997)
    • (1997) IEEE Trans , vol.MTT-45 , pp. 1563-1571
    • Parker, A.E.1    Skellern, D.J.2
  • 14
    • 0032217896 scopus 로고    scopus 로고
    • Pulse measurements quantify dispersion in PHEMTs
    • A E Parker, D E Root, 'Pulse measurements quantify dispersion in PHEMTs' 1998 URSI Symposium 444-449 (1998)
    • (1998) 1998 URSI Symposium , pp. 444-449
    • Parker, A.E.1    Root, D.E.2
  • 16
    • 0032317713 scopus 로고    scopus 로고
    • The importance of gate charge formulation in large-signal PHEMT modeling
    • R Mallavarpu, D Teeter, M Snow, 'The importance of gate charge formulation in large-signal PHEMT modeling', GaAs IC Conf. 87-90 (1998)
    • (1998) GaAs IC Conf. , pp. 87-90
    • Mallavarpu, R.1    Teeter, D.2    Snow, M.3
  • 17
    • 0034430565 scopus 로고    scopus 로고
    • Bias-dependent linear scalable mm-wave FET model
    • J Wood, D E Root 'Bias-dependent linear scalable mm-wave FET model', IEEE Trans MTT-48 2352-60 (2000)
    • (2000) IEEE Trans , vol.MTT-48 , pp. 2352-2360
    • Wood, J.1    Root, D.E.2
  • 18
    • 84870286567 scopus 로고    scopus 로고
    • A production FET modeling and library generation system
    • D McGinty, D E Root, J Perdomo, 'A production FET modeling and library generation system' MANTECH'97 145-148 (1997)
    • (1997) MANTECH'97 , pp. 145-148
    • McGinty, D.1    Root, D.E.2    Perdomo, J.3
  • 19
    • 4444290222 scopus 로고    scopus 로고
    • A M Teetzel, to be published
    • A M Teetzel, to be published.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.