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Volumn 85, Issue 5-6, 2008, Pages 1128-1130

Electrothermal microgrippers for pick-and-place operations

Author keywords

Atomic force microscopy; Carbon nanotubes; Microgrippers; Nanomanipulation; Pick and place

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; MANIPULATORS; SCANNING ELECTRON MICROSCOPY; TWO DIMENSIONAL;

EID: 44149121972     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2007.12.080     Document Type: Article
Times cited : (37)

References (10)
  • 6
    • 35948978186 scopus 로고    scopus 로고
    • S. Fatikow, S. Kray, V. Eichhorn, S. Tautz, in: Development of a Nanohandling Robot Station for Nanocharacterization by an AFM Probe, IEEE Mediterranean Conference on Control and Automation (MED), Ancona, Italy, June 28-30, 2006, WEA4-4.
    • S. Fatikow, S. Kray, V. Eichhorn, S. Tautz, in: Development of a Nanohandling Robot Station for Nanocharacterization by an AFM Probe, IEEE Mediterranean Conference on Control and Automation (MED), Ancona, Italy, June 28-30, 2006, WEA4-4.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.