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Volumn 85, Issue 5-6, 2008, Pages 744-748
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Investigation of high-resolution contact printing
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Author keywords
Contact lithography; Lithography simulation; Submicron patterning
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Indexed keywords
COMPUTER SIMULATION;
LIGHTING;
LITHOGRAPHY;
PHOTORESISTS;
CONTACT LITHOGRAPHY;
CONVENTIONAL PHOTORESIST;
OPTICAL RESOLVING POWER;
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EID: 44149107999
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2007.12.012 Document Type: Article |
Times cited : (12)
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References (6)
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