Temperature dependence of ZnO thin films grown on Si substrate

Journal of Materials Science: Materials in Electronics

Volumn 19, Issue 8-9, 2008, Pages 749-754

  Kim, Y Y ^a   Ahn, C H ^a   Kang, S W ^a   Kong, B H ^a   Mohanta, S K ^a   Cho, H K ^a   Lee, J Y ^b   Kim, H S ^b  

^a Sungkyunkwan University   (South Korea)

^b Korea Maritime University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; GRAIN SIZE AND SHAPE; OPTICAL PROPERTIES; SEMICONDUCTING SILICON; SEMICONDUCTING ZINC COMPOUNDS; STRUCTURAL PROPERTIES; SUBSTRATES; SURFACE MORPHOLOGY; TENSILE STRAIN; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

COLUMNAR GRAINS; SILICON SUBSTRATE; ZINC OXIDE THIN FILM;

ZINC OXIDE;

EID: 44149103874     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-007-9402-6     Document Type: Conference Paper

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