Fault models and yield analysis for QCA-based PLAs

Proceedings - 2007 International Conference on Field Programmable Logic and Applications, FPL

Volumn , Issue , 2007, Pages 435-440

  Crocker, Michael ^a   Hu, X Sharon ^a   Niemier, Michael ^a  

^a University of Notre Dame   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATA THEORY; CELLULAR AUTOMATA; PATTERN RECOGNITION SYSTEMS; RANDOM ACCESS STORAGE; SEMICONDUCTOR QUANTUM DOTS;

DEVICE ARCHITECTURES; FAULT MODELS; PROGRAMMABLE LOGIC ARRAYS; SCALING TRENDS; YIELD ANALYSIS;

SEQUENTIAL MACHINES;

EID: 44049109233     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FPL.2007.4380685     Document Type: Conference Paper

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