Staebler-Wronski-like formation of defects at the amorphous-silicon- crystalline silicon interface during illumination

Journal of Applied Physics

Volumn 103, Issue 9, 2008, Pages

  Plagwitz, Heiko ^a   Terheiden, Barbara ^a   Brendel, Rolf ^a  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; INTERFACES (MATERIALS); LIGHTING; SUBSTRATES;

DEFECT MODEL; SURFACE PASSIVATION;

AMORPHOUS MATERIALS;

EID: 44049104372     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2913320     Document Type: Article

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