-
1
-
-
29344446159
-
Characterization of AlF3 thin films at 193nm by thermal evaporation
-
C. C. Lee, M.C. Liu, M. Kaneko, K. Nakahira, and Y. Takano, "Characterization of AlF3 thin films at 193nm by thermal evaporation, " Appl. Opt. 44, 7333-7338 (2005).
-
(2005)
Appl. Opt
, vol.44
, pp. 7333-7338
-
-
Lee, C.C.1
Liu, M.C.2
Kaneko, M.3
Nakahira, K.4
Takano, Y.5
-
2
-
-
0036603183
-
Development of optical coatings for 157-nm lithography i coating materials
-
S. Niisaka, T. Saito, J. Saito, A. Tanaka, A. Matsumoto, M. Otani, R. Biro, C. Ouchi, M. Hasegawa, Y. Suzuki, and K. Sone, "Development of optical coatings for 157-nm lithography I coating materials, " Appl. Opt. 41, 3242-3247 (2002).
-
(2002)
Appl. Opt
, vol.41
, pp. 3242-3247
-
-
Niisaka, S.1
Saito, T.2
Saito, J.3
Tanaka, A.4
Matsumoto, A.5
Otani, M.6
Biro, R.7
Ouchi, C.8
Hasegawa, M.9
Suzuki, Y.10
Sone, K.11
-
3
-
-
0021515089
-
Vacuum ultraviolet loss in magnesium fluoride films
-
O. R. Wood II, H. G. Craighead, J. E. Sweeney, and P. J. Maloney, "Vacuum ultraviolet loss in magnesium fluoride films, " Appl. Opt. 23, 3644-3649 (1984).
-
(1984)
Appl. Opt
, vol.23
, pp. 3644-3649
-
-
Wood, O.R.1
Craighead, H.G.2
Sweeney, J.E.3
Maloney, P.J.4
-
4
-
-
84975660029
-
Materials for optical coatings in the ultraviolet
-
F. Rainer, W. H. Lowdermilk, D. Milam, C. K. Carniglia, T Tuttle Hart, and T. L. Lichtenstein, "Materials for optical coatings in the ultraviolet, " Appl. Opt. 24, 496-500 (1985).
-
(1985)
Appl. Opt
, vol.24
, pp. 496-500
-
-
Rainer, F.1
Lowdermilk, W.H.2
Milam, D.3
Carniglia, C.K.4
Tuttle Hart, T.5
Lichtenstein, T.L.6
-
5
-
-
2442536714
-
Film structure and optical constants of magnetron-sputtered fluoride films for deep ultraviolet lithography
-
Y. Taki, "Film structure and optical constants of magnetron-sputtered fluoride films for deep ultraviolet lithography, " Vacuum 74, 431-435 (2004).
-
(2004)
Vacuum
, vol.74
, pp. 431-435
-
-
Taki, Y.1
-
6
-
-
43849099342
-
A new process for the deposition of alf3 thin films
-
B. H. Liao, M. C. Liu, and C. C. Lee, "A New Process for the Deposition of AlF3 Thin Films, " Appl. Opt. 47, C41-C45 (2008).
-
(2008)
Appl. Opt
, vol.47
, pp. C41-C45
-
-
Liao, B.H.1
Liu, M.C.2
Lee, C.C.3
-
7
-
-
34547422501
-
AlF3 thin films deposited by reactive magnetron sputtering with Al target
-
C. C. Lee, B. H. Liao, and M. C. Liu, "AlF3 thin films deposited by reactive magnetron sputtering with Al target, " Opt. Express 15, 9152-9156 (2007).
-
(2007)
Opt. Express
, vol.15
, pp. 9152-9156
-
-
Lee, C.C.1
Liao, B.H.2
Liu, M.C.3
-
8
-
-
0029322994
-
Variable-Angle spectroscopic ellipsometry for deep UV characterization of dielectric coating
-
A. Zuber, N. Kaiser, and J.L. Stehle, "Variable-Angle spectroscopic ellipsometry for deep UV characterization of dielectric coating, " Thin Solid Films 261, 37-43 (1995).
-
(1995)
Thin Solid Films
, vol.261
, pp. 37-43
-
-
Zuber, A.1
Kaiser, N.2
Stehle, J.L.3
-
9
-
-
0020114383
-
A kinetic study of plasma-etching process. I. A model for the etching of Si and SiO2 in CnFm/H2 and CnFm/O2 plasmas
-
M.J. Kushner, "A kinetic study of plasma-etching process. I. A model for the etching of Si and SiO2 in CnFm/H2 and CnFm/O2 plasmas, " J.Apply. Phys. 53(4), 2923-2938 (1982).
-
(1982)
J.Apply. Phys
, vol.53
, Issue.4
, pp. 2923-2938
-
-
Kushner, M.J.1
-
10
-
-
0037151375
-
Mass spectrometric studies of ionic products in CF4/He and CF4/O2/He microwave discharge plasmas
-
Keiichiro Iwase, P Christopher Selvin, Gen Sato, and Toshihiro Fujii, "Mass spectrometric studies of ionic products in CF4/He and CF4/O2/He microwave discharge plasmas, " J. Phys. D: Appl. Phys. 35, 1934-1938 (2002).
-
(2002)
J. Phys D: Appl. Phys
, vol.35
, pp. 1934-1938
-
-
Iwase, K.1
Christopher Selvin, P.2
Sato, G.3
Fujii, T.4
-
11
-
-
33645315495
-
Microstructure related properties at 193nm of MgF2 and GdF3 films deposited by resistive heating boat
-
M. C. Liu, C. C. Lee, M. Kaneko, K. Nakahira, and Y. Takano, "Microstructure related properties at 193nm of MgF2 and GdF3 films deposited by resistive heating boat, " Appl. Opt. 45, 1368-1374 (2006).
-
(2006)
Appl. Opt
, vol.45
, pp. 1368-1374
-
-
Liu, M.C.1
Lee, C.C.2
Kaneko, M.3
Nakahira, K.4
Takano, Y.5
-
12
-
-
25644435759
-
Microstructure related properties of Lanthanum Fluoride Films Deposited by Molybdenum Boat Evaporation at 193 nm
-
M. C. Liu, C. C. Lee, M. Kaneko, K. Nakahira, and Y. Takano, "Microstructure related properties of Lanthanum Fluoride Films Deposited by Molybdenum Boat Evaporation at 193 nm, " Thin Solid Films 492/1-2, 45-51 (2005).
-
(2005)
Thin Solid Films
, vol.492
, Issue.1-2
, pp. 45-51
-
-
Liu, M.C.1
Lee, C.C.2
Kaneko, M.3
Nakahira, K.4
Takano, Y.5
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