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Volumn 16, Issue 10, 2008, Pages 6904-6909

Developing new manufacturing methods for the improvement of AlF3thin films

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; MAGNETRON SPUTTERING; MICROSTRUCTURE; OPTICAL PROPERTIES; PLASMA ETCHING; SURFACE ROUGHNESS; THIN FILMS;

EID: 43849109949     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.006904     Document Type: Article
Times cited : (15)

References (12)
  • 1
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    • (2005) Appl. Opt , vol.44 , pp. 7333-7338
    • Lee, C.C.1    Liu, M.C.2    Kaneko, M.3    Nakahira, K.4    Takano, Y.5
  • 3
    • 0021515089 scopus 로고
    • Vacuum ultraviolet loss in magnesium fluoride films
    • O. R. Wood II, H. G. Craighead, J. E. Sweeney, and P. J. Maloney, "Vacuum ultraviolet loss in magnesium fluoride films, " Appl. Opt. 23, 3644-3649 (1984).
    • (1984) Appl. Opt , vol.23 , pp. 3644-3649
    • Wood, O.R.1    Craighead, H.G.2    Sweeney, J.E.3    Maloney, P.J.4
  • 5
    • 2442536714 scopus 로고    scopus 로고
    • Film structure and optical constants of magnetron-sputtered fluoride films for deep ultraviolet lithography
    • Y. Taki, "Film structure and optical constants of magnetron-sputtered fluoride films for deep ultraviolet lithography, " Vacuum 74, 431-435 (2004).
    • (2004) Vacuum , vol.74 , pp. 431-435
    • Taki, Y.1
  • 6
    • 43849099342 scopus 로고    scopus 로고
    • A new process for the deposition of alf3 thin films
    • B. H. Liao, M. C. Liu, and C. C. Lee, "A New Process for the Deposition of AlF3 Thin Films, " Appl. Opt. 47, C41-C45 (2008).
    • (2008) Appl. Opt , vol.47 , pp. C41-C45
    • Liao, B.H.1    Liu, M.C.2    Lee, C.C.3
  • 7
    • 34547422501 scopus 로고    scopus 로고
    • AlF3 thin films deposited by reactive magnetron sputtering with Al target
    • C. C. Lee, B. H. Liao, and M. C. Liu, "AlF3 thin films deposited by reactive magnetron sputtering with Al target, " Opt. Express 15, 9152-9156 (2007).
    • (2007) Opt. Express , vol.15 , pp. 9152-9156
    • Lee, C.C.1    Liao, B.H.2    Liu, M.C.3
  • 8
    • 0029322994 scopus 로고
    • Variable-Angle spectroscopic ellipsometry for deep UV characterization of dielectric coating
    • A. Zuber, N. Kaiser, and J.L. Stehle, "Variable-Angle spectroscopic ellipsometry for deep UV characterization of dielectric coating, " Thin Solid Films 261, 37-43 (1995).
    • (1995) Thin Solid Films , vol.261 , pp. 37-43
    • Zuber, A.1    Kaiser, N.2    Stehle, J.L.3
  • 9
    • 0020114383 scopus 로고
    • A kinetic study of plasma-etching process. I. A model for the etching of Si and SiO2 in CnFm/H2 and CnFm/O2 plasmas
    • M.J. Kushner, "A kinetic study of plasma-etching process. I. A model for the etching of Si and SiO2 in CnFm/H2 and CnFm/O2 plasmas, " J.Apply. Phys. 53(4), 2923-2938 (1982).
    • (1982) J.Apply. Phys , vol.53 , Issue.4 , pp. 2923-2938
    • Kushner, M.J.1
  • 10
    • 0037151375 scopus 로고    scopus 로고
    • Mass spectrometric studies of ionic products in CF4/He and CF4/O2/He microwave discharge plasmas
    • Keiichiro Iwase, P Christopher Selvin, Gen Sato, and Toshihiro Fujii, "Mass spectrometric studies of ionic products in CF4/He and CF4/O2/He microwave discharge plasmas, " J. Phys. D: Appl. Phys. 35, 1934-1938 (2002).
    • (2002) J. Phys D: Appl. Phys , vol.35 , pp. 1934-1938
    • Iwase, K.1    Christopher Selvin, P.2    Sato, G.3    Fujii, T.4
  • 11
    • 33645315495 scopus 로고    scopus 로고
    • Microstructure related properties at 193nm of MgF2 and GdF3 films deposited by resistive heating boat
    • M. C. Liu, C. C. Lee, M. Kaneko, K. Nakahira, and Y. Takano, "Microstructure related properties at 193nm of MgF2 and GdF3 films deposited by resistive heating boat, " Appl. Opt. 45, 1368-1374 (2006).
    • (2006) Appl. Opt , vol.45 , pp. 1368-1374
    • Liu, M.C.1    Lee, C.C.2    Kaneko, M.3    Nakahira, K.4    Takano, Y.5
  • 12
    • 25644435759 scopus 로고    scopus 로고
    • Microstructure related properties of Lanthanum Fluoride Films Deposited by Molybdenum Boat Evaporation at 193 nm
    • M. C. Liu, C. C. Lee, M. Kaneko, K. Nakahira, and Y. Takano, "Microstructure related properties of Lanthanum Fluoride Films Deposited by Molybdenum Boat Evaporation at 193 nm, " Thin Solid Films 492/1-2, 45-51 (2005).
    • (2005) Thin Solid Films , vol.492 , Issue.1-2 , pp. 45-51
    • Liu, M.C.1    Lee, C.C.2    Kaneko, M.3    Nakahira, K.4    Takano, Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.