-
1
-
-
84975660029
-
Materials for optical coatings in the ultraviolet
-
F. Rainer, W. H. Lowdermilk, D. Milam, C. K. Carniglia, T. T. Hart, and T. L. Lichtenstein, "Materials for optical coatings in the ultraviolet," Appl. Opt. 24, 496-500 (1985).
-
(1985)
Appl. Opt
, vol.24
, pp. 496-500
-
-
Rainer, F.1
Lowdermilk, W.H.2
Milam, D.3
Carniglia, C.K.4
Hart, T.T.5
Lichtenstein, T.L.6
-
2
-
-
0003072653
-
Vacuum evaporated films of aluminum fluoride
-
W. Heitmann, "Vacuum evaporated films of aluminum fluoride," Thin Solid Films 5, 61-67 (1970).
-
(1970)
Thin Solid Films
, vol.5
, pp. 61-67
-
-
Heitmann, W.1
-
5
-
-
0036603183
-
Development of optical coatings for 157-nm lithography. I. Coating materials
-
S. Niisaka, T. Saito, J. Saito, A. Tanaka, A. Matsumoto, M. Otani, R. Biro, C. Ouchi, M. Hasegawa, Y. Suzuki, and K. Sone, "Development of optical coatings for 157-nm lithography. I. Coating materials," Appl. Opt. 41, 3242-3247 (2002).
-
(2002)
Appl. Opt
, vol.41
, pp. 3242-3247
-
-
Niisaka, S.1
Saito, T.2
Saito, J.3
Tanaka, A.4
Matsumoto, A.5
Otani, M.6
Biro, R.7
Ouchi, C.8
Hasegawa, M.9
Suzuki, Y.10
Sone, K.11
-
6
-
-
0021515089
-
Vacuum ultraviolet loss in magnesium fluoride films
-
O. R. Wood II, H. G. Craighead, J. E. Sweeney, and P. J. Maloney, "Vacuum ultraviolet loss in magnesium fluoride films," Appl. Opt. 23, 3644-3649 (1984).
-
(1984)
Appl. Opt
, vol.23
, pp. 3644-3649
-
-
Wood II, O.R.1
Craighead, H.G.2
Sweeney, J.E.3
Maloney, P.J.4
-
7
-
-
2442536714
-
Film structure and optical constants of magnetron-sputtered fluoride films for deep ultraviolet lithography
-
Y. Taki, "Film structure and optical constants of magnetron-sputtered fluoride films for deep ultraviolet lithography," Vacuum 74, 431-435 (2004).
-
(2004)
Vacuum
, vol.74
, pp. 431-435
-
-
Taki, Y.1
-
8
-
-
33645277363
-
Fluoride antireflection coatings for deep ultraviolet optics deposited by ion-beam sputtering
-
T. Yoshida, K. Nishimoto, K. Sekine, and K. Etoh, "Fluoride antireflection coatings for deep ultraviolet optics deposited by ion-beam sputtering," Appl. Opt. 45, 1375-1379 (2006).
-
(2006)
Appl. Opt
, vol.45
, pp. 1375-1379
-
-
Yoshida, T.1
Nishimoto, K.2
Sekine, K.3
Etoh, K.4
-
9
-
-
0029322994
-
Variable-angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings
-
A. Zuber, N. Kaiser, and J.L. Stehlé, "Variable-angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings," Thin Solid Films 261, 37-43 (1995).
-
(1995)
Thin Solid Films
, vol.261
, pp. 37-43
-
-
Zuber, A.1
Kaiser, N.2
Stehlé, J.L.3
-
11
-
-
25644435759
-
Microstructure related properties of lanthanum fluoride films deposited by molybdenum boat evaporation at 193 nm
-
M.-C. Liu, C.-C. Lee, M. Kaneko, K. Nakahira, and Y. Takano, "Microstructure related properties of lanthanum fluoride films deposited by molybdenum boat evaporation at 193 nm," Thin Solid Films 492, 45-51 (2005).
-
(2005)
Thin Solid Films
, vol.492
, pp. 45-51
-
-
Liu, M.-C.1
Lee, C.-C.2
Kaneko, M.3
Nakahira, K.4
Takano, Y.5
-
12
-
-
33750870243
-
Microstructure of magnesium fluoride films deposited by boat evaporation at 193 nm
-
M.-C. Liu, C.-C. Lee, M. Kaneko, K. Nakahira, and Y. Takano, "Microstructure of magnesium fluoride films deposited by boat evaporation at 193 nm," Appl. Opt. 45, 7319-7324 (2006).
-
(2006)
Appl. Opt
, vol.45
, pp. 7319-7324
-
-
Liu, M.-C.1
Lee, C.-C.2
Kaneko, M.3
Nakahira, K.4
Takano, Y.5
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