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Volumn 47, Issue 13, 2008, Pages

Process for deposition of AlF3 thin films

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; FLUORINE COMPOUNDS; MICROSTRUCTURE; OPTICAL PROPERTIES; SPUTTERING;

EID: 43849099342     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.000C41     Document Type: Article
Times cited : (15)

References (12)
  • 2
    • 0003072653 scopus 로고
    • Vacuum evaporated films of aluminum fluoride
    • W. Heitmann, "Vacuum evaporated films of aluminum fluoride," Thin Solid Films 5, 61-67 (1970).
    • (1970) Thin Solid Films , vol.5 , pp. 61-67
    • Heitmann, W.1
  • 7
    • 2442536714 scopus 로고    scopus 로고
    • Film structure and optical constants of magnetron-sputtered fluoride films for deep ultraviolet lithography
    • Y. Taki, "Film structure and optical constants of magnetron-sputtered fluoride films for deep ultraviolet lithography," Vacuum 74, 431-435 (2004).
    • (2004) Vacuum , vol.74 , pp. 431-435
    • Taki, Y.1
  • 8
    • 33645277363 scopus 로고    scopus 로고
    • Fluoride antireflection coatings for deep ultraviolet optics deposited by ion-beam sputtering
    • T. Yoshida, K. Nishimoto, K. Sekine, and K. Etoh, "Fluoride antireflection coatings for deep ultraviolet optics deposited by ion-beam sputtering," Appl. Opt. 45, 1375-1379 (2006).
    • (2006) Appl. Opt , vol.45 , pp. 1375-1379
    • Yoshida, T.1    Nishimoto, K.2    Sekine, K.3    Etoh, K.4
  • 9
    • 0029322994 scopus 로고
    • Variable-angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings
    • A. Zuber, N. Kaiser, and J.L. Stehlé, "Variable-angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings," Thin Solid Films 261, 37-43 (1995).
    • (1995) Thin Solid Films , vol.261 , pp. 37-43
    • Zuber, A.1    Kaiser, N.2    Stehlé, J.L.3
  • 11
    • 25644435759 scopus 로고    scopus 로고
    • Microstructure related properties of lanthanum fluoride films deposited by molybdenum boat evaporation at 193 nm
    • M.-C. Liu, C.-C. Lee, M. Kaneko, K. Nakahira, and Y. Takano, "Microstructure related properties of lanthanum fluoride films deposited by molybdenum boat evaporation at 193 nm," Thin Solid Films 492, 45-51 (2005).
    • (2005) Thin Solid Films , vol.492 , pp. 45-51
    • Liu, M.-C.1    Lee, C.-C.2    Kaneko, M.3    Nakahira, K.4    Takano, Y.5
  • 12
    • 33750870243 scopus 로고    scopus 로고
    • Microstructure of magnesium fluoride films deposited by boat evaporation at 193 nm
    • M.-C. Liu, C.-C. Lee, M. Kaneko, K. Nakahira, and Y. Takano, "Microstructure of magnesium fluoride films deposited by boat evaporation at 193 nm," Appl. Opt. 45, 7319-7324 (2006).
    • (2006) Appl. Opt , vol.45 , pp. 7319-7324
    • Liu, M.-C.1    Lee, C.-C.2    Kaneko, M.3    Nakahira, K.4    Takano, Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.