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4344591852
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note
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The V-shaped cantilevers used were purchased from Thermo-Microscopes, California. Spring constants varied from 0.04 to 0.01 N/m for the 220-320 μm long cantilevers, respectively. Leg width and thickness for both cantilevers were 22 μm and 600 nm, respectively.
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19
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4344626171
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Laroche, O.1
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4344569781
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note
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Gaertner Scientific, model L116C. The ellipsometer laser used had a wavelength of 632.5 nm and an angle of incidence of 70°. A constant index of refraction of 1.459 was used for dodecanethiol SAM thickness determination.
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21
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4344674754
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note
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V-4 grade mica was purchased from SPI Supplies, PA. Mica substrates were freshly cleaved prior to evaporation.
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22
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4344584573
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note
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Digital Intruments, USA.
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23
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4344631076
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note
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Goodfellow Cambridge Limited, U.K.
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24
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4344685517
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note
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Thermionics Laboratory Inc., USA, model VE-90.
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25
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4344646025
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note
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Alfa Aesar, CAN, 99.995% purity.
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26
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4344674163
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note
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Angstrom Sciences, USA, 99.99% purity.
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27
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4344697816
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note
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The resolution of the ellipsometric measurement was 0.1 nm.
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