Pb(Mg1/3Nb2/3)O3 and (1 - X)Pb(Mg 1/3Nb2/3)O3 - xPbTiO3 relaxor ferroelectric thick films: Processing and electrical characterization

Journal of Electroceramics

Volumn 12, Issue 3, 2004, Pages 151-161

  Gentil, S ^a   Damjanovic, D ^a   Setter, N ^a  

^a Faculty of Engineering   (Switzerland)

Author keywords

Piezoelectric; PMN; PMN PT; Relaxor; Thick films

Indexed keywords

DENSIFICATION; DIFFERENTIAL THERMAL ANALYSIS; FERROELECTRIC MATERIALS; HYSTERESIS; LEAD COMPOUNDS; MORPHOLOGY; PARTICLE SIZE ANALYSIS; PERMITTIVITY; PEROVSKITE; PIEZOELECTRICITY; SINTERING; STRAIN; TRANSDUCERS; X RAY DIFFRACTION ANALYSIS;

OMN-PT; PIEZOELECTRIC RESPONSES; PMN; RELAXORS;

THICK FILMS;

EID: 4344667183     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JECR.0000037720.39443.e3     Document Type: Article

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