Non-Gaussian resistance fluctuations in disordered materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5471, Issue , 2004, Pages 38-47

  Pennetta, C ^a,b   Alfinito, E ^a,b   Reggiani, L ^a,b   Ruffo, S ^c  

^a INFM   (Italy)

^b UNIVERSITY OF SALENTO   (Italy)

^c UNIVERSITY OF FLORENCE   (Italy)

Author keywords

Disordered materials; Electrical breakdown; Non equilibrium steady states; Non Gaussian distributions

Indexed keywords

DISORDERED MATERIALS; MACROSCOPIC SYSTEMS; NON-EQUILIBRIUM STEADY STATES; NON-GAUSSIAN DISTRIBUTIONS;

COMPUTER SIMULATION; ELECTRIC BREAKDOWN; ELECTRIC RESISTANCE; MATHEMATICAL MODELS; MONTE CARLO METHODS; RESISTORS; STOCHASTIC PROGRAMMING; THIN FILMS;

NANOTECHNOLOGY;

EID: 4344628168     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.546781     Document Type: Conference Paper

References (30)

1. B. Chakrabarti and L. Benguigui, Statistical Physics of Fracture and Breakdown in Disordered Systems, Oxford Univ. Press, Oxford, 1997.
2. M. B. Weissman, "1/f and other slow nonexponential kinetics in condensed matter," Rev. Mod. Phys. 60, pp. 537-571, 1988.
3. S. Bramwell, P. Holdsworth, and J. F. Pinton, "Universality of rare fluctuations in turbulence and critical phenomena," Nature 396, pp. 552-554, 1998.
4. S. Bramwell, K. Christensen, J. Y. Fortin, P. C. W. Holdsworth, H. Jensen, S. Lise, J. M. López, M. Nicodemi, J. F. Pinton, and M. Sellitto, "Universal fluctuations in correlated systems," Phys. Rev. Lett. 84, pp. 3744-3747, 2000.
5. V. Aji and N. Goldenfeld, "Fluctuations in finite critical and turbulent systems," Phys. Rev. Lett. 86, pp. 1107-1010, 2001.
6. αsignals," Phys. Rev. E 65, pp. 046140-1-12, 2002.
7. V. Eisler, Z. Rácz, and F. van Wijland, "Magnetization distribution in the transverse ising chain with energy flux," Phys. Rev. E 67, pp. 56129-1-8, 2003.
8. S. Bramwell, J. Y. Fortin, P. C. W. Holdsworth, S. Peysson, J. F. Pinton, B. Portelli, and M. Sellitto, "Magnetic fluctuations in the classical xy model: The origin of an exponential tail in a complex system," Phys. Rev. E 63, pp. 041106-1-22, 2001.
9. T. Antal, M. Droz, G. Györgyi, and Z. Rácz, "1/f noise and extreme value statistics," Phys. Rev. Lett. 87, pp. 24061-1-4, 2001.
10. B. Portelli, P. Holdsworth, M. Sellitto, and S. Bramwell, "Universal magnetic fluctuations with a field-induced length scale," Phys. Rev. E 64, pp. 036111-1-6, 2001.
11. K. Dahlstedt and H. Jensen, "Universal fluctuations and extreme-value statistics," J. Phys. A 34, pp. 11193-11200, 2001.
12. N. Vandewalle, M. Ausloos, M. Houssa, P. W. Mertens, and M. M. Heyns, "Non-gaussian behavior and anticorrelations in ultrathin gate oxides after soft breakdown," Appl. Phys. Lett. 74, pp. 1579-1581, 1999.
13. A. Hansen, S. Roux, and E. L. Hinrichsen, "Annealed model for breakdown processes," Europhys. Lett. 13, pp. 341-347, 1990.
14. L. Lamaignère, F. Carmona, and D. Sornette, "Experimental realization of critical thermal fuse rupture," Phys. Rev. Lett. 77, pp. 2738-2741, 1996.
15. J. V. Andersen, D. Sornette, and K. Leung, "Tricritical behavior in rupture induced by disorder," Phys. Rev. Lett. 78, pp. 2140-2143, 1997.
16. S. Zapperi, P. Ray, H. E. Stanley, and A. Vespignani, "First order transition in the breakdown of disordered media," Phys. Rev. Lett. 78, pp. 1408-1411, 1997.
17. C. D. Mukherjee, K. K. Bardhan, and M. B. Heaney, "Predictable electrical breakdown in composites," Phys. Rev. Lett. 83, pp. 1215-1218, 1999.
18. C. D. Mukherjee and K. K. Bardhan, "Critical behavior of thermal relaxation near a breakdown point," Phys. Rev. Lett. 91, pp. 025702-1-4, 2003.
19. C. Pennetta, L. Reggiani, and G. Trefan, "Scaling and universality in electrical failure of thin films," Phys. Rev. Lett. 84, pp. 5006-5009, 2000.
20. C. Pennetta, G. Trefan, and L. Reggiani, "A percolative approach to resistance fluctuations," in Unsolved Problems of Noise and Fluctuations, L. B. K. D. Abbott, ed., AIP Conf. Proc. 551, pp. 447-452, 1999.
21. C. Pennetta, L. Reggiani, G. Trefan, and E. Alfinito, "Resistance and resistance fluctuations in random resistor networks under biased percolation," Phys. Rev. E 65, pp. 066119-1-10, 2002.
22. C. Pennetta, "Resistance noise near to electrical breakdown:steady state of random networks as function of the bias," Fluct. Noise Lett. 2, pp. R29-49, 2002.
23. C. Pennetta, L. Reggiani, G. Trefan, F. Fantini, A. Scorzoni, and I. D. Munari, "A percolative approach to electromigration in metallic lines," J. Phys. D: Appl. Phys. 34, pp. 1421-1429, 2001.
24. Z. Gingl, C. Pennetta, L. B. Kish, and L. Reggiani, "Biased percolation and abrupt failure of electronic devices," Semic. Sci. Techn. 11, pp. 1770-1775, 1996.
25. D. Stauffer and A. Aharony, Introduction to Percolation Theory, Taylor and Francis, London, 1992.
26. C. Pernnetta, G. Trefan, and L. Reggiani, "Scaling law of resistance fluctuations in stationary random resistor networks," Phys. Rev. Lett. 85, pp. 5238-5241, 2000.
27. C. Pennetta, E. Alfmito, L. Reggiani, and S. Ruffo, "Non-gaussianity of resistance fluctuations near electrical breakdown," Semic. Sci. Techn. 19, pp.-, 2004.
28. C. Pennetta, E. Alfinito, L. Reggiani, and S. Ruffo, "Non-gaussian resistance noise near electrical breakdown in granular materials," in print on Physica A, pp.-, 2004.
29. C. Pennetta, E. Alfinito, and L. Reggiani, "Steady state of random resistor networks under biased percolation: a framework for noise in disorderd media?," in Unsolved Problems of Noise and Fluctuations, S. M. Bezrukov, ed., AIP Conf. Proc. 665, pp. 480-487, 2004.
30. C. Pennetta and E. Alfinito, "unpublished," - -, pp. -, -.