Steady State of Random Resistor Networks under Biased Percolation: A Framework for Noise in Disordered Materials?

AIP Conference Proceedings

Volumn 665, Issue , 2003, Pages 480-487

  Pennetta, Cecilia ^a,b   Alfinito, Eleonora ^a   Reggiani, Lino ^a,b  

^a NATIONAL NANOTECHNOLOGY LABORATORY   (Italy)

^b UNIVERSITY OF SALENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

GAUSSIAN NOISE (ELECTRONIC); RESISTORS;

DISORDERED MATERIALS; ELECTRICAL BREAKDOWN; ELECTRICAL CONDUCTION; ELECTRICAL NOISE; LINEAR REGIME; PROPERTY; RANDOM RESISTOR NETWORKS; RESISTANCE FLUCTUATION; STATISTICAL APPROACH; STEADY STATE;

SOLVENTS;

EID: 1942514678     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1584924     Document Type: Conference Paper

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