Testing high resolution ADCs using deterministic dynamic element matching

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 1, Issue , 2004, Pages

  Olleta, Beatriz ^a   Jiang, Hanjun ^a   Chen, Degang ^a   Geiger, Randall ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; COMPUTER SIMULATION; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; MIXER CIRCUITS; SEMICONDUCTING SILICON; SIGNAL ENCODING; SIGNAL GENERATORS; THERMOMETERS; VECTORS;

CYCLIC SWITCHING SEQUENCES; DYNAMIC ELEMENT MATCHING (DME); MIXED SIGNAL CIRCUITS; RECTANGULAR ARRAYS;

ANALOG TO DIGITAL CONVERSION;

EID: 4344580623     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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