On-chip digital jitter measurement, from megahertz to gigahertz

IEEE Design and Test of Computers

Volumn 21, Issue 4, 2004, Pages 314-321

  Sunter, Stephen ^a   Roy, Aubin ^a  

^a LogicVision Canada Inc   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; BUILT-IN SELF TEST; JITTER; OSCILLOGRAPHS; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; WAVEFORM ANALYSIS;

DETERMINISTIC JITTER; JITTER MEASUREMENT; RANDOM JITTER;

INTEGRATED CIRCUIT TESTING;

EID: 4344566297     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2004.38     Document Type: Article

References (9)

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