Low strain sensitivity of the dielectric property of pyrochlore Bi-Zn-Nb-O films

Applied Physics Letters

Volumn 92, Issue 18, 2008, Pages

  Funakubo, Hiroshi ^a   Okaura, Shingo ^a   Suzuki, Muneyasu ^a   Uchida, Hiroshi ^b   Koda, Seiichiro ^b   Ikariyama, Rikyu ^a   Yamada, Tomoaki ^a,c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b SOPHIA UNIVERSITY   (Japan)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

PERMITTIVITY; POLYCRYSTALLINE MATERIALS; STRAIN MEASUREMENT; THERMAL EXPANSION;

CRYSTALLINITY; PYROCHLORE FILMS; RESIDUAL STRAIN; THERMAL STRAIN SENSITIVITY;

POLYMER FILMS;

EID: 43349104176     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2919723     Document Type: Article

References (14)

1. D. P. Cann, C. A. Randall, and T. R. Shrout, Solid State Commun. 100, 529 (1996).
2. I. Levin, T. G. Amos, J. C. Nino, T. A. Vanderah, C. A. Randall, and M. T. Lanagan, Solid State Commun. 168, 69 (2002).
3. I. Levin, T. G. Amos, J. C. Nino, T. A. Vanderah, I. M. Reaney, C. A. Randall, and M. T. Lanagan, J. Mater. Res. 17, 1406 (2002).
4. J. Lu and S. Stemmer, Appl. Phys. Lett. 83, 2411 (2003).
5. J. C. Nino, M. T. Lanagan, and C. A. Randall, J. Appl. Phys. 89, 4512 (2001).
6. W. Ren, S. Trolier-McKinstry, C. A. Randall, and T. R. Shrout, J. Appl. Phys. 89, 767 (2001).
7. Y. P. Hong, S. Ha, H. Y. Lee, Y. C. Lee, K. H. Ko, D.-W. Kim, H. B. Hong, and K. S. Hong, Thin Solid Films 419, 183 (2002).
8. H.-F. Cheng and Y.-C. Chen, J. Appl. Phys. 87, 479 (2000).
9. S. Okaura, M. Suzuki, S. Okamoto, H. Uchida1, S. Koda, and H. Funakubo, Jpn. J. Appl. Phys., Part 1 44, 6957 (2005).
10. H. Funakubo, S. Okaura, M. Suzuki, H. Uchida, and S. Koda, Key Eng. Mater. (unpublished).
11. J. Lu, D. O. Klenov, and S. Stemmer, Appl. Phys. Lett. 84, 957 (2004).
12. S. Ito, H. Funakubo, I. Koutsaroff, M. Zelner, and A. Cervin-Lawry, Appl. Phys. Lett. 90, 142910 (2007).
13. A. Tagantsev, V. Sherman, K. Astafiev, J. Venkatesh, and N. Setter, J. Electroceram. 11, 5 (2003).
14. T. M. Shaw, Z. Suo, M. Huang, E. Liniger, R. B. Laibowitz, and J. D. Baniecki, Appl. Phys. Lett. 75, 2129 (1999).