Kondo effect by controlled cleavage of a single-molecule contact

Nanotechnology

Volumn 19, Issue 6, 2008, Pages

  Temirov, R ^a,b   Lassise, A ^a   Anders, F B ^c   Tautz, F S ^a,b  

^a JACOBS UNIVERSITY BREMEN   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

^c UNIVERSITY OF BREMEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC VARIABLES MEASUREMENT; KONDO EFFECT; MOLECULAR ORBITALS; NUMERICAL METHODS; SCANNING TUNNELING MICROSCOPY;

CONDUCTANCE MEASUREMENTS; EPITAXIAL MOLECULE-METAL BOND;

MOLECULAR STRUCTURE;

NANOWIRE; OXYGEN; SILVER;

AB INITIO CALCULATION; ARTICLE; ATOM; CONDUCTANCE; MOLECULE; NANOTECHNOLOGY; PRIORITY JOURNAL; SEMICONDUCTOR; SPECTROSCOPY;

EID: 43049145513     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/6/065401     Document Type: Article

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