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Volumn 516, Issue 14, 2008, Pages 4639-4644
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Erratum to "Influence of contaminations on the performance of thin-film silicon solar cells prepared after in situ reactor plasma cleaning" [Thin Solid Films 516 (2008 4639-4644)] (DOI:10.1016/j.tsf.2007.06.013);Influence of contaminations on the performance of thin-film silicon solar cells prepared after in situ reactor plasma cleaning
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Author keywords
a Si:H; Chemical memory effect (CME); Dry cleaning; PECVD; Thin film
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Indexed keywords
DRY CLEANING;
IMPURITIES;
LIGHTING;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
THIN FILMS;
CHEMICAL MEMORY EFFECT (CME);
IN SITU REACTOR CLEANING;
PLASMA DIAGNOSTICS;
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EID: 42949118768
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2008.07.024 Document Type: Erratum |
Times cited : (11)
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References (17)
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