SCOPUS 정보 검색 플랫폼

Volumn 354, Issue 19-25, 2008, Pages 2529-2533

High-performance hydrogenated amorphous silicon TFT on flexible metal foil with polyimide planarization

Author keywords

Atomic force and scanning tunneling microscopy; Mechanical, stress relaxation; Spin coating; Thin film transistors

Indexed keywords

ATOMIC FORCE MICROSCOPY; METAL FOIL; SCANNING TUNNELING MICROSCOPY; SPIN COATING; STRESS RELAXATION; THIN FILM TRANSISTORS;

POLYIMIDE PLANARIZATION; ROOM TEMPERATURE;

AMORPHOUS SILICON;

EID: 42649131382 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2007.09.034 Document Type: Article

Times cited : (16)

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