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Volumn 354, Issue 19-25, 2008, Pages 2305-2309

Spatially localized current-induced crystallization of amorphous silicon films

Author keywords

Atomic force and scanning tunneling microscopy; Crystallization; Nanocrystals; Silicon

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; ELECTRIC FIELDS; NANOCRYSTALS; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

CONSTANT CURRENT; NANOSCALE PITS; ROOM TEMPERATURE;

AMORPHOUS SILICON;

EID: 42649120121 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2007.10.045 Document Type: Article

Times cited : (9)

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