Dependence of the properties of compositionally graded Pb(Zr,Ti)O3 ferroelectric films of the bottom electrode

Ceramics International

Volumn 34, Issue 4, 2008, Pages 1031-1034

  Jiankang, Li ^a   Xi, Yao ^b  

^a SUZHOU UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

A. Sol gel processes; C. Ferroelectric properties; D. PZT

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRODES; HEAT TREATMENT; LEAD COMPOUNDS; SOL-GEL PROCESS; THIN FILMS;

BOTTOM ELECTRODES; CRYSTALLOGRAPHIC ORIENTATION; FERROELECTRIC PROPERTIES; REMNANT POLARIZATIONS;

FERROELECTRIC FILMS;

EID: 42649110708     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2007.09.106     Document Type: Article

References (8)

1. 3 thin films with different crystallographic orientations. Thin Solid Films 436 (2003) 157-161
2. 3 thin films with enhanced dielectric and ferroelectric properties. Appl. Phys. Lett. 76 (2000) 1063-1065
3. Lu S.G., Zhu X.H., Mak C.L., Wong K.H., Chan H.L.W., and Choy C.L. Compositionally graded epitaxial barium strontium titanate thin films derived from pulsed laser deposition. Mater. Chem. Phys. 79 (2003) 164-168
4. 3 ferroelectric films on different Pt bottom electrodes. Appl. Surf. Sci. 158 (2000) 21-27
5. 3 thin films. Thin Solid Films 416 (2002) 66-71
6. 3 (1 0 0) substrates by the chemical solution method. Mater. Res. Bull. 34 (1999) 2069-2074
7. 3-coated silicon by modified sol-gel process. J. Cryst. Growth 260 (2004) 109-114
8. 3 films grown on Si(0 0 1) by pulsed laser deposition. Thin Sold Films 405 (2002) 117-121