Microstructures of LaNiO3 films grown on Si(001) by pulsed laser deposition

Thin Solid Films

Volumn 405, Issue 1-2, 2002, Pages 117-121

  Kim, Sang Sub ^a   Kang, Tae Soo ^b   Je, Jung Ho ^b  

^a Sunchon National University   (South Korea)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Atomic force microscopy; Growth mechanism; Laser ablation; X Ray diffraction

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; FILM GROWTH; LANTHANUM COMPOUNDS; MICROSTRUCTURE; PULSED LASER DEPOSITION; SYNCHROTRONS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

SYNCHROTRON X-RAY SCATTERING;

THIN FILMS;

EID: 0037154918     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01735-7     Document Type: Article

References (15)