Optical characterization of vanadium-titanium oxide films

Thin Solid Films

Volumn 516, Issue 14, 2008, Pages 4563-4567

  Kakiuchida, Hiroshi ^a   Jin, Ping ^a   Tazawa, Masato ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Composite oxide; Dielectric constants; Ellipsometry; Titanium; Vanadium; XRD

Indexed keywords

COMPOSITE FILMS; ELLIPSOMETRY; PERMITTIVITY; SPUTTERING; X RAY DIFFRACTION;

COMPOSITE OXIDES; OPTICAL CHARACTERIZATION; SPUTTERING DEPOSITION;

VANADIUM COMPOUNDS;

EID: 42649105496     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.05.096     Document Type: Article

References (30)

1. Xu G., Jin P., Tazawa M., and Yoshimura K. Jpn. J. Appl. Phys. 43 (2004) 186
2. Morin F.J. Phys. Rev. Lett. 3 (1959) 34
3. Goodenough J.B. J. Solid State Chem. 3 (1971) 490
4. Jin P., Xu G., Tazawa M., and Yoshimura K. Jpn. J. Appl. Phys. 41 (2002) L178
5. Jin P., Xu G., Tazawa M., and Yoshimura K. Appl. Phys. A47 (2003) 455
6. Kato K., Song P.K., Okada H., and Shigesato Y. Jpn. J. Appl. Phys. 42 (2003) 6523
7. Jin P., Nakao S., and Tanemura S. Thin Solid Films 324 (1998) 151
8. Khan K.A., and Granqvist C.G. Appl. Phys. Lett. 55 (1989) 4
9. Burkhardt W., Christmann T., Franke S., Kriegseis W., Meister D., Meyer B.K., Niessner W., Schalch D., and Scharmann A. Thin Solid Films 402 (2002) 226
10. Golubev V.G., Davydov V.Y., Kartenko N.F., Kurdyukov D.A., Medvedev A.V., Pevtsov A.B., Scherbakov A.V., and Shadrin E.B. Appl. Phys. Lett. 79 (2001) 2127
11. Xiao D., Kim K.W., and Zavada J.M. J. Appl. Phys. 97 (2005) 106102
12. Maaza M., Nemraoui O., Sella C., Beye A.C., and Baruch-Barak B. Opt. Commun. 254 (2005) 188
13. Xu G., Chen Y., Tazawa M., and Jin P. J. Phys. Chem., B 110 (2006) 2051
14. Lopez R., Boatner L.A., Haynes T.E., Haglund Jr. R.F., and Feldman L.C. Appl. Phys. Lett. 85 (2004) 1410
15. Lopez R., Feldman L.C., and Haglund Jr. R.F. Phys. Rev. Lett. 93 (2004) 177403
16. Bugayev A.A., and Gupta M.C. Opt. Lett. 28 (2003) 1463
17. Tazawa M., Jin P., and Tanemura S. Appl. Opt. 37 (1998) 1858
18. Takahashi I., Hibino M., and Kudo T. Jpn. J. Appl. Phys. 40 (2001) 1391
19. Beteille F., Morineau R., Livage J., and Nagano M. Mater. Res. Bull. 32 (1997) 1109
20. Zhao G., Kozuka H., Lin H., Takahashi M., and Yoko T. Thin Solid Films 340 (1999) 125
21. Soltani M., Chaker M., Haddad E., Kruzelecky R.V., and Margot J. Appl. Phys. Lett. 85 (2004) 1958
22. Fujiwara H., Koh J., Rovira P.I., and Collins R.W. Phys. Rev., B 61 (2000) 10832
23. 2 thermochromic film design of solar energy control window", ISES Solar World Congress Proc., Orlando, FL, (2005), 1095, supplied by CD.
24. Gavini A., and Kwan C.C.Y. Phys. Rev., B 5 (1972) 3138
25. Shin S., Suga S., Taniguchi M., Fujisawa M., Kanzaki H., Fujimori A., Daimon H., Ueda Y., Kosuge K., and Kachi S. Phys. Rev., B 41 (1990) 4993
26. JCPDS #89-4920.
27. JCPDS #82-0661.
28. Ribarsky M.W. In: Palik E.D. (Ed). Handbook of Optical Constants of Solids (1985), Academic Press, San Diego 795
29. Cullity B.D. Elements of X-ray Diffraction (1956), Addison-Wesley Pub., Reading, Massachsetts 96
30. Cardona M., and Harbeke G. Phys. Rev. 137 (1965) A1467