Towards accurate and efficient reliability modeling of nanoelectronic circuits

2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006

Volumn 1, Issue , 2006, Pages 395-398

  Taylor, Erin ^a   Han, Jie ^a   Fortes, José ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

Fault tolerance; Nanoelectronics; Reliability

Indexed keywords

FAULT TOLERANCE; NETWORKS (CIRCUITS); PROBABILISTIC LOGICS; RELIABILITY ANALYSIS;

CIRCUIT RELIABILITY ESTIMATION; PROBABILISTIC GATE MODELS;

NANOELECTRONICS;

EID: 42549140212     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/nano.2006.247660     Document Type: Conference Paper

References (8)

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