Reliability modeling of nanoelectronic circuits

2005 5th IEEE Conference on Nanotechnology

Volumn 1, Issue , 2005, Pages 269-272

  Han, Jie ^a   Taylor, Erin ^a   Gao, Jianbo ^a   Fortes, José ^a  

^a University of Florida   (United States)

Author keywords

Fault tolerance; Nanoelectronics; Nanotechnology; Probabilistic; Reliability; Simulation

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; LOGIC GATES; NANOTECHNOLOGY; NETWORKS (CIRCUITS); PROBABILITY;

FUNDAMENTAL ERROR; NANOELECTRONIC CIRCUITS; PROBABILISTIC MODELS;

NANOSTRUCTURED MATERIALS;

EID: 33746970449     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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