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Volumn 19, Issue 10, 2008, Pages

Solvent-mediated repair and patterning of surfaces by AFM

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FREE ENERGY; LASER DAMAGE; LITHOGRAPHY; ORGANIC SOLVENTS;

EID: 42549138368     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/10/105304     Document Type: Article
Times cited : (21)

References (47)
  • 10
    • 33646412344 scopus 로고    scopus 로고
    • Ewing G E 2006 Chem. Rev. 106 1511-26
    • (2006) Chem. Rev. , vol.106 , Issue.4 , pp. 1511-1526
    • Ewing, G.E.1
  • 15
    • 34548759168 scopus 로고    scopus 로고
    • An atomic view on fundamental transport processes on metal surfaces
    • Giesen M 2007 An atomic view on fundamental transport processes on metal surfaces AIP Conf. Proc. vol 916 ed J Skowrongski et al (New York: Melville) pp 115-35
    • (2007) AIP Conf. Proc. , vol.916 , pp. 115-135
    • Giesen, M.1
  • 20
    • 42549125138 scopus 로고
    • Crystal growth and characterization
    • Keller K W 1974 Crystal growth and characterization Proc. ISSCG2 Spring School ed R Ueda and J B Mullin (Japan: North-Holland)
    • (1974) Proc. ISSCG2 Spring School
    • Keller, K.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.