Correlations between the microstructure of Ag-Si3N4 multilayers and their optical properties

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 313-317

  Girardeau, T ^a   Camelio, S ^a   Babonneau, D ^a   Toudert, J ^a   Barranco, A ^a  

^a Lab de Métallugie Physique   (France)

Author keywords

Metallic nanoclusters; Non spherical shape; Optical properties; Spectroscopic ellipsometry; Surface plasmon resonance

Indexed keywords

ELLIPSOMETRY; MICROSTRUCTURE; MULTILAYERS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; SPECTROSCOPIC ANALYSIS; SPUTTERING; SURFACE PLASMON RESONANCE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTROMAGNETIC INTERACTIONS; METALLIC NANOCLUSTERS; NON-SPHERICAL SHAPE; SPECTROSCOPIC ELLIPSOMETRY;

SILVER COMPOUNDS;

EID: 17144461102     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.080     Document Type: Conference Paper

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