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Volumn 13, Issue 4, 2002, Pages 465-470

Structural studies of Ag nanocrystals embedded in amorphous Al2O3 grown by pulsed laser deposition

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CHARACTERIZATION; COALESCENCE; CRYSTAL STRUCTURE; ELLIPSOMETRY; FILM GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; LASER ABLATION; NANOSTRUCTURED MATERIALS; PULSED LASER DEPOSITION; SEMICONDUCTING ALUMINUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036690075     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/13/4/305     Document Type: Article
Times cited : (63)

References (20)
  • 19
    • 0010251369 scopus 로고    scopus 로고
    • SRIM-2000.40 The stopping and range of ions in matter modelling software, copyright 1998. 1999 IBM Co.
    • Ziegler, J.F.1    Biersach, J.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.