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Volumn 18, Issue 2, 2008, Pages

Room temperature electrometry with SUB-10 electron charge resolution

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRONS; MICROMACHINING; PRESSURE EFFECTS;

EID: 42549095448     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/18/2/025033     Document Type: Article
Times cited : (43)

References (16)
  • 1
    • 0036892362 scopus 로고    scopus 로고
    • Chipmunk IV: Development of and experience with a new generation of radiation area monitors for accelerator applications
    • Krueger F and Larson J 2002 Chipmunk IV: development of and experience with a new generation of radiation area monitors for accelerator applications Nucl. Instrum. Methods Phys. Res. A 495 20-8
    • (2002) Nucl. Instrum. Methods Phys. Res. , vol.495 , Issue.1 , pp. 20-28
    • Krueger, F.1    Larson, J.2
  • 4
    • 0034040401 scopus 로고    scopus 로고
    • Special feature: Miniature mass analyzers
    • Badman E R and Cooks R G 2000 Special feature: miniature mass analyzers J. Mass Spectrom. 35 659-71
    • (2000) J. Mass Spectrom. , vol.35 , pp. 659-671
    • Badman, E.R.1    Cooks, R.G.2
  • 6
    • 0036567515 scopus 로고    scopus 로고
    • Micromechanical electrometry of single-electron transistor island charge
    • Blencowe M P and Zhang Y 2002 Micromechanical electrometry of single-electron transistor island charge Physica B 316-317 411-2
    • (2002) Physica , vol.316-317 , Issue.1 , pp. 411-412
    • Blencowe, M.P.1    Zhang, Y.2
  • 7
    • 31544442967 scopus 로고    scopus 로고
    • Foundry metal-oxide- semiconductor field-effect transistor electrometer for single-electron detection
    • Clement N and Inokawa H 2005 Foundry metal-oxide- semiconductor field-effect transistor electrometer for single-electron detection Japan J. Appl. Phys. 44 4855-8
    • (2005) Japan J. Appl. Phys. , vol.44 , pp. 4855-4858
    • Clement, N.1    Inokawa, H.2
  • 8
    • 0032510577 scopus 로고    scopus 로고
    • A nanometer-scale mechanical electrometer
    • Cleland A N and Roukes M L 1998 A nanometer-scale mechanical electrometer Nature 392 160-2
    • (1998) Nature , vol.392 , Issue.6672 , pp. 160-162
    • Cleland, A.N.1    Roukes, M.L.2
  • 9
    • 0034164129 scopus 로고    scopus 로고
    • Nanomechanical resonators operating as charge detectors in the nonlinear regime
    • Kroemmer H, Erbe A, Tilke A, Manus S and Blick R H 2000 Nanomechanical resonators operating as charge detectors in the nonlinear regime Europhys. Lett. 50 101-6
    • (2000) Europhys. Lett. , vol.50 , Issue.1 , pp. 101-106
    • Kroemmer, H.1    Erbe, A.2    Tilke, A.3    Manus, S.4    Blick, R.H.5
  • 10
    • 0000700109 scopus 로고    scopus 로고
    • Room temperature Al single-electron transistor made by electron-beam lithography
    • Pashkin Yu A, Nakamura Y and Tsai J S 2000 Room temperature Al single-electron transistor made by electron-beam lithography Appl. Phys. Lett. 76 2255-8
    • (2000) Appl. Phys. Lett. , vol.76 , Issue.16 , pp. 2256-2258
    • Pashkin Yu, A.1    Nakamura, Y.2    Tsai, J.S.3
  • 12
    • 0242559624 scopus 로고
    • Principles of a new portable electrometer
    • Gunn R 1932 Principles of a new portable electrometer Phys. Rev. 40 307-12
    • (1932) Phys. Rev. , vol.40 , Issue.2 , pp. 307-312
    • Gunn, R.1
  • 15
    • 48349102498 scopus 로고    scopus 로고
    • A variable capacitor based MEMS electrometer
    • Lee J, Zhu Y and Seshia A A 2006 A variable capacitor based MEMS electrometer Proc. 20th Eurosensors (Gothenburg, Sweden, 17-20 Sep. 2006)
    • (2006) Proc. 20th Eurosensors
    • Lee, J.1    Zhu, Y.2    Seshia, A.A.3
  • 16
    • 34247505046 scopus 로고    scopus 로고
    • System-level simulation of a micromachined electrometer using a time-domain variable capacitor model
    • Zhu Y, Lee J and Seshia A A 2007 System-level simulation of a micromachined electrometer using a time-domain variable capacitor model J. Micromech. Microeng. 17 1059-65
    • (2007) J. Micromech. Microeng. , vol.17 , Issue.5 , pp. 1059-1065
    • Zhu, Y.1    Lee, J.2    Seshia, A.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.