SCOPUS 정보 검색 플랫폼

Physica B: Condensed Matter

Volumn 316-317, Issue , 2002, Pages 411-412

Micromechanical electrometry of single-electron transistor island charge

(2) Blencowe, M P a Zhang, Yong a

a Dartmouth College (United States)

Author keywords

Micromechanical systems; Single electron transistors

Indexed keywords

BANDWIDTH; CAPACITANCE; COMPOSITE MICROMECHANICS; DAMPING; ELASTIC MODULI; ELECTRIC RESISTANCE; ELECTRODES; ELECTRON TUNNELING; GATES (TRANSISTOR); PROBABILITY; SPURIOUS SIGNAL NOISE;

MICROMECHANICAL ELECTROMETRY; SINGLE-ELECTRON TRANSISTORS (SET);

ELECTROMETERS;

EID: 0036567515 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-4526(02)00529-X Document Type: Conference Paper

Times cited : (3)

References (11)

1
- 0001630171
- (1987) Phys. Rev. Lett. , vol.59 , pp. 109
- Fulton, T.A.¹ Dolan, G.J.²

2
- 0001174768
- (1999) J. Appl. Phys. , vol.86 , pp. 2132
- Starmark, B.¹ Henning, T.² Claeson, T.³ Delsing, P.⁴ Korotkov, A.N.⁵

3
- 0001280707
- (2000) J. Low Temp. Phys. , vol.118 , pp. 287
- Krupenin, V.A.¹ Presnov, D.E.² Zorin, A.B.³ Niemeyer, J.⁴

4
- 0035894444
- (2001) Phys. Rev. B , vol.64 , pp. 245116
- Heij, C.P.¹ Hadley, P.² Mooij, J.E.³

5
- 0003973069
- B.L. Altshuler, P.A. Lee, R.A. Webb (Eds.), Elsevier, Amsterdam
- (1991) Mesoscopic Phenomena in Solids
- Averin, D.V.¹ Likharev, K.K.²

6
- 0032510577
- (1998) Nature , vol.392 , pp. 160
- Cleland, A.N.¹ Roukes, M.L.²

7
- 0033715350
- (2000) Physica , vol.284 , pp. 2143
- Mohanty, P.¹ Harrington, D.A.² Roukes, M.L.³

8
- 0035851551
- (2001) Appl. Phys. Lett. , vol.79 , pp. 3358
- Mamin, H.J.¹ Rugar, D.²

9
- 0001727837
- (1994) Phys. Rev. B , vol.49 , pp. 10381
- Korotkov, A.N.¹

10
- 0006187062
- cond-mat/0109412, to appear
- J. Appl. Phys.
- Zhang, Y.¹ Blencowe, M.P.²

11
- 0000819848
- (1997) Appl. Phys. Lett. , vol.71 , pp. 288
- Stowe, T.D.¹ Yasumura, K.² Kenny, T.W.³ Botkin, D.⁴ Wago, K.⁵ Rugar, D.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.