The structure study of amorphous nanocrystalline nanocomposite films of germanium by AFM and EXAFS methods

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 547-551

  Valeev, Rishat G ^a   Deev, Andrew N ^a   Surnin, Dmitry V ^a   Kriventsov, Vladimir V ^b   Karban, Oksana V ^a   Vetoshkin, Vladimir M ^a   Pivovarova, Olesya I ^a  

^a PHYSICOTECHNICAL INSTITUTE   (Russian Federation)

^b BORESKOV INSTITUTE OF CATALYSIS   (Russian Federation)

Author keywords

AFM; Anomalous properties; EXAFS; Thin nanocomposite films of Ge

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; EVAPORATION; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; NANOCOMPOSITES; NANOCRYSTALLINE MATERIALS;

AMORPHOUS PHASES; NANOCOMPOSITE FILMS;

GERMANIUM;

EID: 42449160112     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2765     Document Type: Conference Paper

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