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Applied Surface Science

Volumn 185, Issue 1-2, 2001, Pages 34-43

Characterization and tribological investigation of SiO 2 and La 2 O 3 sol-gel films

(3) Zhang, Wenguang a,b Liu, Weimin a Wang, Chengtao b

a LANZHOU INSTITUTE OF CHEMICAL PHYSICS (China)

b SHANGHAI JIAO TONG UNIVERSITY (China)

Author keywords

AFM; Depth profiling; La 2 O 3; SiO 2; Thin films; Tribological properties; XPS

Indexed keywords

ABRASION; ATOMIC FORCE MICROSCOPY; BRITTLE FRACTURE; DELAMINATION; FRICTION; LANTHANUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SILICA; SOL-GELS; TRIBOLOGY; WEAR RESISTANCE;

SOL-GEL FILMS;

THIN FILMS;

EID: 0035965973 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(01)00568-2 Document Type: Article

Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.