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Volumn 95, Issue 5, 2003, Pages 433-440

Application of trial functions in the iteration process of solving inverse ill-posed problems of EXAFS spectroscopy

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EID: 30244549772     PISSN: 0031918X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (15)
  • 5
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    • (1979) Models of Disorder: The Theoretical Physics of Homogeneously Disordered Systems
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  • 6
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    • Zabinsky, S.I., Rehr, J.J., Ankudinov, A.O., et al., Multiple-Scattering Calculations of X-Ray-Absorption Spectra, Phys. Rev. B: Condens. Matter, 1995, vol. 52, no. 4, pp. 2995-3009.
    • (1995) Phys. Rev. B: Condens. Matter , vol.52 , Issue.4 , pp. 2995-3009
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  • 8
    • 0000467436 scopus 로고
    • Short-range order in crystalline, amorphous, and supercooled germanium probed by X-ray-absorption spectroscopy
    • Filliponi, A. and Di Cicco, A., Short-Range Order in Crystalline, Amorphous, and Supercooled Germanium Probed by X-ray-Absorption Spectroscopy, Phys. Rev. B: Condens. Matter, 1995, vol. 51, no. 18, pp. 12322-12336.
    • (1995) Phys. Rev. B: Condens. Matter , vol.51 , Issue.18 , pp. 12322-12336
    • Filliponi, A.1    Di Cicco, A.2
  • 10
    • 0000074430 scopus 로고
    • Thickness effects on the extended X-ray absorption fine structure
    • Stern, E.A. and Kim, K., Thickness Effects on the Extended X-ray Absorption Fine Structure, Phys. Rev. B: Condens. Matter, 1981, vol. 23, pp. 3781-3792.
    • (1981) Phys. Rev. B: Condens. Matter , vol.23 , pp. 3781-3792
    • Stern, E.A.1    Kim, K.2
  • 11
    • 0033440416 scopus 로고    scopus 로고
    • Correction of XAFS amplitude distortions caused by the thickness effect
    • Bausk, N.V., Erenburg, S.B., and Mazalov, L.N., Correction of XAFS Amplitude Distortions Caused by the Thickness Effect, J. Synchr. Rad., 1999, vol. 6, no. 3, pp. 268-270.
    • (1999) J. Synchr. Rad. , vol.6 , Issue.3 , pp. 268-270
    • Bausk, N.V.1    Erenburg, S.B.2    Mazalov, L.N.3
  • 12
    • 0035450442 scopus 로고    scopus 로고
    • Correction of X-ray absorption spectra for thickness inhomogeneity and fluorescence of sample
    • Babanov, Yu.A., Ryazhkin, A.V., and Miyanaga, T., Correction of X-ray Absorption Spectra for Thickness Inhomogeneity and Fluorescence of Sample, Nucl. Instrum. Methods Phys. Res., Sect. A, 2001, vol. 470, nos. 1-2, pp. 278-282.
    • (2001) Nucl. Instrum. Methods Phys. Res., Sect. A , vol.470 , Issue.1-2 , pp. 278-282
    • Babanov, Yu.A.1    Ryazhkin, A.V.2    Miyanaga, T.3
  • 13
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    • Determination of sample thickness distribution and correction of X-ray absorption spectra
    • in press
    • Babanov, Yu.A., Ryazhkin, A.V., Pilyugin, V.P., et al., Determination of Sample Thickness Distribution and Correction of X-ray Absorption Spectra, Phys. Rev. B: Condens. Matter (in press).
    • Phys. Rev. B: Condens. Matter
    • Babanov, Yu.A.1    Ryazhkin, A.V.2    Pilyugin, V.P.3
  • 15
    • 30244566758 scopus 로고
    • Total-electron-yield current measurements for near surface extended X-ray-absorption fine structure
    • Erbil, A., Cargill III, G.S., Frahm, R., and Boehme, R.F., Total-Electron-Yield Current Measurements for Near Surface Extended X-ray-Absorption Fine Structure, Phys. Rev. B: Condens. Matter, 1988, vol. 37, no. 5, pp. 2450-2464.
    • (1988) Phys. Rev. B: Condens. Matter , vol.37 , Issue.5 , pp. 2450-2464
    • Erbil, A.1    Cargill G.S. III2    Frahm, R.3    Boehme, R.F.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.