Self-interstitial–hydrogen complexes in silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 24, 1999, Pages 15729-15732

  Briddon, P R ^c   Jones, R ^a  

^a UNIVERSITY OF EXETER   (United Kingdom)

^b LULEÅ UNIVERSITY OF TECHNOLOGY   (Sweden)

^c NEWCASTLE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243590582     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.15729     Document Type: Article

References (24)

1. S. K. Estreicher, Mater. Sci. Eng., R.14, 319 (1995).
2. G. R. Bai, M W. Qi, L M. Xie, and T S. Shi, Solid State Commun.56, 277 (1985).
3. C. H. Tindal, J W. Straley, and H H. Nielsen, Phys. Rev.62, 151 (1942).
4. T. S. Shi, L M. Xie, G R. Bai, and M W. Qi, Phys. Status Solidi B131, 511 (1985).
5. B. Bech Nielsen, L. Hoffmann, M. Budde, R. Jones, J. Goss, and S. Öberg, Mater. Sci. Forum196, 933 (1995).
6. Y. K. Park, S K. Estreicher, C W. Myles, and P A. Fedders, Phys. Rev. B52, 1718 (1995).
7. B. Bech Nielsen, L. Hoffmann, and M. Budde, Mater. Sci. Eng., B36, 259 (1996).
8. P. Stallinga, P. Johannesen, S. Herstrom, K. Bond Nielsen, B. Bech Nielsen, and J R. Byberg, Phys. Rev. B58, 3842 (1998).
9. C. G. Van de Walle and J. Neugebauer, Phys. Rev. B52, 14 320 (1995).
10. M. Budde, B. Bech Nielsen, P. Leary, J. Goss, R. Jones, P R. Briddon, S. Öberg, and S J. Breuer, Phys. Rev. B57, 4397 (1998).
11. M. Suezawa, Mater. Sci. Forum258, 229 (1997).
12. M. Suezawa, Jpn. J. Appl. Phys., Part 237, L259 (1998).
13. T. Abe, H. Harada, and J. Chikawa, Physica B & C116, 139 (1983).
14. P. A. Stolk, H J. Gossmann, D J. Eaglesham, D C. Jacobson, C S. Rafferty, G H. Gilmer, M. Jaraiz, J M. Poate, H S. Luftman, and T E. Haynes, J. Appl. Phys.81, 6031 (1997).
15. P. Leary, R. Jones, S. Öberg, and V J B. Torres, Phys. Rev. B55, 2188 (1997).
16. B. G. Svensson, J. Svensson, J L. Lindstrom, G. Davies, and J W. Corbett, Appl. Phys. Lett.51, 2257 (1987).
17. B. G. Svensson and J L. Lindström, J. Appl. Phys.72, 5616 (1992).
18. M. Suezawa, Jpn. J. Appl. Phys., Part 237, L806 (1998).
19. M. Suezawa, J. Appl. Phys.83, 1958 (1998).
20. L. J. Cheng, J C. Corelli, J W. Corbett, and G D. Watkins, Phys. Rev.152, 761 (1966).
21. R. Jones and P. R. Briddon, in Identification of Defects in Semiconductors, edited by M. Stavola, Semiconductors and Semimetals, Vol. 51A (Academic Press, Boston, 1998), Chap. 6.
22. R. E. Pritchard, M J. Ashwin, J H. Tucker, and R C. Newman, Phys. Rev. B57, 15 048 (1998).
23. B. Hourahine, R. Jones, S. Öberg, R C. Newman, P R. Briddon, and E. Roduner, Phys. Rev. B57, 12 666 (1998).
24. J. H. Meal and M K. Wilson, J. Chem. Phys.24, 385 (1956).