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Volumn 299-302, Issue PART 1, 2002, Pages 14-19

Studies on grain boundaries in nanocrystalline silicon grown by hot-wire CVD

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; CRYSTAL ORIENTATION; GRAIN BOUNDARIES; OXIDATION; SECONDARY ION MASS SPECTROMETRY; SILICON; TANTALUM; TRANSMISSION ELECTRON MICROSCOPY;

EID: 4243252445     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(01)00943-7     Document Type: Conference Paper
Times cited : (26)

References (17)
  • 11
    • 0009010473 scopus 로고    scopus 로고
    • PhD thesis, Universitat de Barcelona
    • (1999)
    • Peiró, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.