Soft x-ray resonant magnetic reflectivity study of thin films and multilayers

Journal of Applied Physics

Volumn 83, Issue 11, 1998, Pages 6293-6295

  Tonnerre, J M ^a   Seve L ^a   Barbara Dechelette, A ^a   Bartolome F ^a   Raoux, D ^a   Chakarian, V ^b   Kao, C C ^c   Fischer, H ^d   Andrieu, S ^d   Fruchart, O ^a  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^b NAVAL RESEARCH LABORATORY   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001366046     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367837     Document Type: Article

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